Principles and applications of convergent beam electron diffraction: A bibliography (1938‐1990)

Automated electron diffraction tomography – a new tool for nano crystal structure analysis

“…Apart from high resolution data, electron diffraction can deliver information about the unit cell parameters, the presence of a centre of symmetry in the structure (by convergent beam electron diffraction CBED [11][12][13]), the space group (if extinction conditions are visible), and even special crystallographic features such as superstructure, disorder and twinning. Moreover, the possibility to achieve an electron diffraction nano probe allows to investigate single nano particles separately, and thus to analyse polyphasic systems properly.…”

JECP/HOLZ – an interactive computer program for simulation of HOLZ patterns

“…lattice parameters, strain, local chemical composition, electron potential. Nevertheless, these applications need the aid of computer programs for the simulation of HOLZ line patterns (Sung & Williams, 1991, and references therein). Software packages for the simulation of HOLZ patterns have been presented, for example, by Zuo (1992), Jouneau & Stadelmann (1998) and Vö lkl (1998).…”

Probing semiconductor interfaces by transmission electron microscopy

“…By performing electron diffraction experiments with a small focused probe a wealth of accurate crystallographic information can be obtained concerning semiconductor interfaces. Since the applications of the technique go back over nearly 20 years the interested reader is referred to standard reviews (Steeds 1979;Steeds & Morniroli 1992;Sung 1991;Williams et al 1992). The first application to semiconductor interfaces known to us was published in 1976 (Rackham & Steeds).…”