2002
DOI: 10.1016/s0304-8853(02)00459-6
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Probe-based recording technology

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Cited by 27 publications
(15 citation statements)
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“…In the following 20 years, the theories [4], experiments and fabrications on NSOM developed time and time again. Its applications, including investigating films [5], polymers [6], DNA molecules [7], quantum dots [8], quantum wells [9], food molecules [10], waveguides [11–13], nanoparticles [14], gratings [15], and fabricating nanostructures [16] and nanostorage [17], are also getting wider and wider. In this article, we set up two kinds of different light paths in the NSOM system to investigate the ordinary silicon waveguides.…”
Section: Introductionmentioning
confidence: 99%
“…In the following 20 years, the theories [4], experiments and fabrications on NSOM developed time and time again. Its applications, including investigating films [5], polymers [6], DNA molecules [7], quantum dots [8], quantum wells [9], food molecules [10], waveguides [11–13], nanoparticles [14], gratings [15], and fabricating nanostructures [16] and nanostorage [17], are also getting wider and wider. In this article, we set up two kinds of different light paths in the NSOM system to investigate the ordinary silicon waveguides.…”
Section: Introductionmentioning
confidence: 99%
“…For the past decade, probe-based recording using scanning probe microscope (SPM) has been under development in order to increase the areal density and to decrease the size of the information storage device. Probe-based recording is expected to achieve an areal recording density well beyond 1 Tbit/in 2 [36]. However, there are still many technical issues to be solved before this technology can be properly implemented.…”
Section: Introductionmentioning
confidence: 99%
“…Scanning probe data storage systems have been researched for future miniature high-density data storage devices with a recording density beyond 1 Tb inch −2 [1][2][3]. Many research groups have reported various types of recording methods based on scanning tunneling microscopy (STM) [4,5], atomic force microscopy (AFM) [6][7][8][9][10], and scanning near-field optical microscopy (SNOM) [11,12], etc.…”
Section: Introductionmentioning
confidence: 99%