2017
DOI: 10.1021/acsphotonics.6b00821
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Probing Coherent Surface Plasmon Polariton Propagation Using Ultrabroadband Spectral Interferometry

Abstract: Surface plasmon polaritons (SPPs) are shortlived evanescent waves that can confine light at the surface of metallic nanostructures and transport energy over mesoscopic distances. They may be used to generate and process information encoded as optical signals to realize nanometerscale and ultrafast all-optical circuitry. The propagation properties of these SPPs are defined by the geometry and composition of the nanostructure. Due to their short, femtosecond lifetimes, it has so far proven difficult to track thi… Show more

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Cited by 15 publications
(10 citation statements)
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“…The use of wideband light sources is required to better understand LSP’s linear and nonlinear properties. Here we excite the LSP resonances of rectangular nanoholes on a gold film by a broadband Ti:sapphire oscillator.…”
mentioning
confidence: 99%
“…The use of wideband light sources is required to better understand LSP’s linear and nonlinear properties. Here we excite the LSP resonances of rectangular nanoholes on a gold film by a broadband Ti:sapphire oscillator.…”
mentioning
confidence: 99%
“…The phase variation is equivalent to the introduction of a 200 μm of fused silica. This is attributed to an additional phase shift induced by the plasmons. Therefore, an additional negative dispersion compensation is required for the nanostructures. Compared to the THG emission from the bare sapphire substrate, which is about 15 nm wide (fwhm), the plasmonic structures obviously generate a nearly three times broader spectrum of about 40 nm (fwhm), which supports few cycle pulses down to only 3.1 fs.…”
mentioning
confidence: 99%
“…The fringe spacing and fringe contrast both gradually decrease with increasing distance. These SIs [55][56][57][58] reflect the interference between the grating-coupled SPP field that is incident on the protrusion and scattered towards the detector (E 1 ) and the backpropagating SPP field that is coupled into the far field (E 2 ). The SI, S(ω) = | E 1 (ω) + E 2 (ω) | 2 , thus probes the interference between the incident field E s1 and the backpropagating SPP field E s2 at the position of the scatterer.…”
Section: Resultsmentioning
confidence: 99%