Probing electron trapping by current collapse in GaN/AlGaN FETs utilizing quantum transport characteristics
Takaya Abe,
Motoya Shinozaki,
Kazuma Matsumura
et al.
Abstract:GaN is expected to be a key material for next-generation electronics due to its interesting properties. However, current collapse poses a challenge to the application of GaN FETs to electronic devices. In this study, we investigate the formation of quantum dots in GaN FETs under current collapse. By comparing the Coulomb diamond between standard measurements and those under current collapse, we find that the gate capacitance is significantly decreased under current collapse. This suggests that the current coll… Show more
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