2024
DOI: 10.1002/asna.20240027
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Probing extreme black‐hole outflows on short timescales via high spectral‐resolution x‐ray imagers

C. Pinto,
J. F. Steiner,
A. Bodaghee
et al.

Abstract: We investigate outflows and the physics of super‐Eddington versus sub‐Eddington regimes in black hole systems. Our focus is on prospective science using next‐generation high‐resolution soft x‐ray instruments. We highlight the properties of black hole ultraluminous x‐ray source (ULX) systems in particular. Owing to scale invariance in accreting black holes, ULX accretion properties, including their outflows, inform our understanding not only of the closely related population of (similar‐mass) x‐ray binary syste… Show more

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