Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

Passian, Ali; Wig, A.; Lereu, Aude L.; Evans, Philip G.; Mériaudeau, Fabrice; Thundat, Thomas; Ferrell, T. L.

doi:10.1016/j.ultramic.2003.11.018

Cited by 25 publications

(8 citation statements)

References 30 publications

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“…SPP interference fringes had been observed previously using near-field optical scanning microscopy techniques. 14,15 On the other hand, strong dependence of fringes visibility on the inclination angle of a SPP beam respect to the other has been recently reported using LR techniques. 16 This result raised questions concerning the capability of SPP tomography for providing images that mirror with high fidelity the SPP propagation and interference at the metal-air interface of the sample.…”

Section: Relation Between Lr and Spp Propagationmentioning

confidence: 99%

“…7,9 In SPP tomography, the photons used for imaging are the ones that, regardless of the measurement process, leak to the sample substrate. This is in contrast to near-field scanning optical microscopy techniques, [13][14][15] where an optical tip is often placed in close proximity to the region to be imaged. This proximity introduces inevitable perturbations in the original distribution of electromagnetic fields in the sample.…”

Section: Introductionmentioning

confidence: 99%

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Some consequences of experiments with a plasmonic quantum eraser for plasmon tomography

Peralta

López-Boada

Ruiz-Columbie

et al. 2011

Journal of Applied Physics

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We discuss two important consequences of recent experiments using surface plasmon polariton ͑SPP͒ tomography in a quantum eraser arrangement. In these experiments surface-emission images were modified by manipulating the polarization state of the leakage radiation. We show that SPP tomography does have the potential to produce images that mirror with high fidelity the propagation and interference of SPP beams at the metal-air interface of a sample. We reveal the physical mechanism behind this capability of SPP tomography. In addition, we show how SPP tomography can be used to detect photons passing through the dark fringes of an interference pattern and why photons propagate in such a way that looks like a photon can propagate across a region where it is never observed.

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Section: Relation Between Lr and Spp Propagationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Some consequences of experiments with a plasmonic quantum eraser for plasmon tomography

Peralta

López-Boada

Ruiz-Columbie

et al. 2011

Journal of Applied Physics

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“…These properties were found particularly important in several applications, such as the so-called surface plasmon resonance (SPR) sensing. Despite the many * dikai.niu@fresnel.fr intriguing investigations, the losses associated with electronic excitation in metals have been seen as a bottleneck for a number of sensing and imaging applications [20][21][22][23][24]. Interestingly, all-dielectric multilayers have been shown to exhibit surface modes, which feature similar field characteristics as plasmons but without the losses [25][26][27][28][29][30][31][32][33].…”

Section: Introductionmentioning

confidence: 99%

Excitation of Bloch Surface Waves in Zero-Admittance Multilayers for High-Sensitivity Sensor Applications

et al. 2020

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The growing need for classical as well as quantum optical sensing places increasingly stringent requirements upon the desired characteristics of the engendered fields. Specifically, achieving superior field enhancement plays a critical role in applications ranging from chem-bio sensing, Raman and infrared spectroscopies to ion trapping and qubit control in emerging quantum-information science. Due to their low optical losses and ability to exhibit resonant field enhancements, all dielectric multilayers are emerging as an optical material system not only useful to classical photonics and sensing but also of potential to be integrated with quantum materials and quantum sensing. The recently introduced concept of zeroadmittance layers [1] within dielectric multilayer materials, enables the creation and control of resonant fields orders of magnitude larger than the exciting field. Here, invoking the zero-admittance concept, we design, fabricate, and characterize an all-dielectric nonabsorbing stack and demonstrate the engendered huge field enhancement. Describing the fields in terms of Bloch surface waves, we connect the surface field to the semiperiodicity in the dielectric domains of the stack. As a specific application of the resonant field, we propose and demonstrate refractive-index sensing for the detection of trace amounts of an analyte. The results include a quantification of the sensitivity of the device with respect to the profile of the exciting field. The experimental results are shown to be in good agreement with theoretical calculations.

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“…Numerous work have been reported on dielectric multilayers optimization using both Bloch surface waves [1][2][3][4][5][6][7][8][9][10][11][12][13] or admittance formalism in the total internal reflection conditions [14][15][16][17][18][19] towards giant field enhancement generation [20][21][22][23][24][25][26][27]. Because of the geometric similarities, the optical response of the optimized dielectric multilayers (DM) is often compared [28][29][30][31] with plasmon excitation [32][33][34][35][36] in metal thin films [37]. Resonant DMs can achieve giant optical fields when tuned to their sharp spectral or angular resonances.…”

Section: Introductionmentioning

confidence: 99%

Sensitivity of resonance properties of all-dielectric multilayers driven by statistical fluctuations

Lereu¹,

Lemarchand²,

Zerrad³

et al. 2019

Opt. Express

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In photonics and emerging fields of quantum and topological materials, increasing demands are placed upon the state and control of electromagnetic fields. Dielectric multilayer materials may be designed and optimized to possess extremely sharp spectral and angular photonic resonances allowing for the creation of fields orders of magnitude larger than the exciting field. With enhancements of 10 4 and higher, the extreme nature of these resonances places high constraints on the statistical properties of the physical and optical characteristics of the materials. To what extent the spectral and angular shifts occur as a result of fluctuations in the refractive indices and morphologies of the involved low-loss subdomains have not been considered previously. Here, we present how parameter variations such as those caused by fluctuations in deposition rate, yielding bias, random and compensated errors, may affect the resonance properties of low-loss all-dielectric stacks.

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Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

Cited by 25 publications

References 30 publications

Some consequences of experiments with a plasmonic quantum eraser for plasmon tomography

Some consequences of experiments with a plasmonic quantum eraser for plasmon tomography

Excitation of Bloch Surface Waves in Zero-Admittance Multilayers for High-Sensitivity Sensor Applications

Sensitivity of resonance properties of all-dielectric multilayers driven by statistical fluctuations

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