2013
DOI: 10.1021/nl402407r
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Probing of Optical Near-Fields by Electron Rescattering on the 1 nm Scale

Abstract: We present a new method of measuring optical near-fields within ∼1 nm of a metal surface, based on rescattering of photoemitted electrons. With this method, we precisely measure the field enhancement factor for tungsten and gold nanotips as a function of tip radius. The agreement with Maxwell simulations is very good. Further simulations yield a field enhancement map for all materials, which shows that optical near-fields at nanotips are governed by a geometric effect under most conditions, while plasmon reson… Show more

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Cited by 74 publications
(87 citation statements)
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“…Furthermore, there is a spread of CEP phases, which increases from 0.2 π at a rotation angle of 0 • to 0.6 π at an angle of 80 • . This means that compared to strong-field photoemission experiments in gases and also from edged nanotips, 11,34,35 the strong-field emitted electrons will experience a considerable range of different local field strengths as well as CEPs. We also checked different radii of the transition of the individual facets of 5 and 15 nm for parallel (perpendicular) orientation, which resulted in maximum field enhancements of ∼8.5 (∼5) and ∼14 (∼8.5), respectively.…”
Section: Resultsmentioning
confidence: 99%
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“…Furthermore, there is a spread of CEP phases, which increases from 0.2 π at a rotation angle of 0 • to 0.6 π at an angle of 80 • . This means that compared to strong-field photoemission experiments in gases and also from edged nanotips, 11,34,35 the strong-field emitted electrons will experience a considerable range of different local field strengths as well as CEPs. We also checked different radii of the transition of the individual facets of 5 and 15 nm for parallel (perpendicular) orientation, which resulted in maximum field enhancements of ∼8.5 (∼5) and ∼14 (∼8.5), respectively.…”
Section: Resultsmentioning
confidence: 99%
“…11,34 In inhomogeneous fields at nanostructures, electrons might experience the decay of the near-field during their sub-cycle propagation, [43][44][45] which leads to the suppression of rescattering and a decrease of the cutoff energy compared to Eq. (2).…”
Section: Resultsmentioning
confidence: 99%
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“…Because the semi-classical excursion length of the field-sensing electron is <1 nm, this method allows measuring the optical near-field on extremely small, (sub-) nanometer length scales [32,41], see Figure 6.6a. With an angle-resolved spectrometer, the fields can even be reconstructed in a vectorial fashion [24], as discussed in detail in Chapter 9.…”
Section: Optical Near-field Sensormentioning
confidence: 99%
“…Typical peak near-field intensities at the tip's apex are on the order of I ω ¼ 3 × 10 11 W=cm 2 for the fundamental and I 2ω ¼ 7 × 10 9 W=cm 2 for the second harmonic, including field enhancement [39,40] (see SM for details [31]). The near fields of both colors result in electron emission in the multiphoton regime with minimum Keldysh parameters, γ ¼ ffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi ffi W 0 =2U p p of γ ω;min ¼ 2.7 and γ 2ω;min ¼ 47, where U p is the ponderomotive energy.…”
mentioning
confidence: 99%