2018
DOI: 10.1109/tdmr.2018.2872562
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Probing Plasticity and Strain-Rate Effects of Indium Submicron Pillars Using Synchrotron Laue X-Ray Microdiffraction

Abstract: A nondestructive ex situ Synchrotron Laue X-ray Microdiffraction (µSLXRD) technique is used to investigate the plasticity mechanisms in the metallic nanostructures and their evolution at high homologous temperatures through analyzing low melting temperature metals such as tin. Without the use of expensive high temperature equipment, the current approach of studying plasticity mechanisms at high temperature is enabled by the low melting behaviors of the samples allowing them to provide insights on high temperat… Show more

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Cited by 6 publications
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