2009
DOI: 10.1007/s11458-009-0089-5
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Probing structural changes of spin-coated polystyrene film after swelling and precipitation by synchrotron GIUSAXS and AFM

Abstract: Polystyrene film of about 50 nm in thickness on silicon wafer was obtained by spin-coating in tetrahydrofuran solution. The film exhibits a rough surface as shown by atomic force microscopy images and ellipsometry data. Furthermore, such surface roughness produced a characteristic lateral correlation peak in an "out-ofplane" scan in the synchrotron grazing incidence ultrasmall angle X-ray scattering pattern. The film was treated with liquids of solvent and non-solvent sequentially, resulting in a process of sw… Show more

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