Probing the temperature dependence of the mechanical properties of polymers at the nanoscale with band excitation thermal scanning probe microscopy

Nikiforov, Maxim P.; Jesse, Stephen; Morozovska, Anna N.; Eliseev, Eugene A.; Germinario, Louis T.; Kalinin, Sergei V.

doi:10.1088/0957-4484/20/39/395709

Cited by 58 publications

(62 citation statements)

References 38 publications

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“…The PL spectrum taken on the manipulated QD is centred at 608 nm, and luminescence at this wavelength is completely absent elsewhere in the cell. The full-width at half-maximum (FWHM) of the QD spectra is 108 meV, which corresponds well to the previously studied emission from single colloidal quantum dots, for which PL blinking was recorded to optically identify the emission as being that from a single QD [20–21]. Due to limitations in the collection optics it was not possible to see blinking in our sample.…”

Section: Resultssupporting

confidence: 79%

Combining nanoscale manipulation with macroscale relocation of single quantum dots

Quacquarelli¹,

Woolley²,

Humphry³

et al. 2012

Beilstein J. Nanotechnol.

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SummaryWe have controllably positioned, with nanometre precision, single CdSe quantum dots referenced to a registration template such that the location of a given nanoparticle on a macroscopic (≈1 cm2) sample surface can be repeatedly revisited. The atomically flat sapphire substrate we use is particularly suited to optical measurements of the isolated quantum dots, enabling combined manipulation–spectroscopy experiments on a single particle. Automated nanoparticle manipulation and imaging routines have been developed so as to facilitate the rapid assembly of specific nanoparticle arrangements.

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Section: Resultssupporting

confidence: 79%

Combining nanoscale manipulation with macroscale relocation of single quantum dots

Quacquarelli¹,

Woolley²,

Humphry³

et al. 2012

Beilstein J. Nanotechnol.

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show abstract

“…(6) and the error V 2ω by nonconstant TCR, V 2ω,raw = V 2ω,ideal + V 2ω,error . Equation (6) shows that V 2ω,ideal = 0 when η = 0, making V 2ω,raw = V 2ω,error when η = 0. For small η, V 2ω,error remains constant and the error can be corrected by finding V 2ω,error when η = 0 and then subtracting it from V 2ω,raw when η = 0.…”

Section: A Nonconstant Temperature Coefficient Of Resistancementioning

confidence: 99%

“…[3][4][5][6][7] Temperature calibration of heated AFM cantilevers is critically important for these and other applications. This article reports AFM cantilever temperature measurement and calibration under periodic heating.…”

Section: Introductionmentioning

confidence: 99%

2-ω and 3-ω temperature measurement of a heated microcantilever

Lee

King

2012

Review of Scientific Instruments

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This article describes temperature measurement of a heated atomic force microscope cantilever using the 2ω and 3ω harmonics of the cantilever temperature signal. When the cantilever is periodically heated, large temperature oscillations lead to large changes in the cantilever electrical resistance and also lead to nonconstant temperature coefficient of resistance. We model the cantilever heating to account for these sources of nonlinearity, and compare models with experiment. When the heating voltage amplitude is 17.9 V over the driving frequency range 10 Hz-34 kHz, the cantilever temperature oscillation is between 5 °C and 200 °C. Over this range, the corrected 2ω method predicts cantilever temperature to within 16% and the corrected 3ω method predicts the cantilever temperature within 3%. We show a general method for predicting the periodic cantilever temperature, sources of errors, and corrections for these errors.

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“…The main difference between SThEM and TA-AFAM is a method used for excitation of contact resonance. [ 111 ] In case of SThEM, probe is heated with oscillating voltage and thermal expansion of the material under the tip drives contact resonance; in case of TA-AFAM, oscillations of the whole sample drives contact resonance while the probe is kept at constant temperature. While still in infancy, a number of studies have demonstrated mapping of melting and glass transition temperatures and dynamic thermomechanical characterization of polymer materials.…”

Section: Electromechanical Probesmentioning

confidence: 99%

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

Kalinin

Balke

2010

Advanced Materials

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Energy storage and conversion systems are an integral component of emerging green technologies, including mobile electronic devices, automotive, and storage components of solar and wind energy economics. Despite the rapidly expanding manufacturing capabilities and wealth of phenomenological information on the macroscopic device behaviors, the microscopic mechanisms underpinning battery and fuel cell operations in the nanometer-micrometer range are virtually unknown. This lack of information is due to the dearth of experimental techniques capable of addressing elementary mechanisms involved in battery operation, including electronic and ion transport, vacancy injection, and interfacial reactions, on the nanometer scale. In this article, a brief overview of scanning probe microscopy (SPM) methods addressing nanoscale electrochemical functionalities is provided and compared with macroscopic electrochemical methods. Future applications of emergent SPM methods, including near field optical, electromechanical, microwave, and thermal probes and combined SPM-(S)TEM (scanning transmission electron microscopy) methods in energy storage and conversion materials are discussed.

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Probing the temperature dependence of the mechanical properties of polymers at the nanoscale with band excitation thermal scanning probe microscopy

Cited by 58 publications

References 38 publications

Combining nanoscale manipulation with macroscale relocation of single quantum dots

Combining nanoscale manipulation with macroscale relocation of single quantum dots

2-ω and 3-ω temperature measurement of a heated microcantilever

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

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