Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Baykara, Mehmet Z.; Dagdeviren, Omur E.; Schwendemann, Todd C.; Mönig, Harry; Altman, Eric I.; Schwarz, Udo D.

doi:10.3762/bjnano.3.73

Cited by 26 publications

(40 citation statements)

References 65 publications

(133 reference statements)

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“…14,15 While combined 3D-AFM/STM can provide a wealth of information regarding atomic-scale surface properties, its application is far from routine, as the method requires extended measurement times due to the acquisition of multiple images or spectroscopy curves as well as several postmeasurement data processing steps. 16,17 In an attempt to obtain information on both chemical interactions and surface charge distributions with less experimental effort, several research groups have acquired simultaneous two-dimensional STM/NC-AFM data instead. Three approaches have been used.…”

Section: ■ Introductionmentioning

confidence: 99%

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

et al. 2015

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In high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip−sample interactions to collect complementary information about the sample surface. A popular choice involves simultaneous scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) measurements, which are thought to reflect the chemical and electronic properties of the sample surface. With surface-oxidized Cu(100) as an example, we investigate whether atomic-scale information on chemical interactions can be reliably extracted from frequency shift maps obtained while using the tunneling current as the feedback parameter. Ab initio calculations of interaction forces between specific tip apexes and the surface are utilized to compare experiments with theoretical expectations. The examination reveals that constant-current operation may induce a noticeable influence of topography-feedback-induced cross-talk on the frequency shift data, resulting in misleading interpretations of local chemical interactions on the surface. Consequently, the need to apply methods such as 3D-AFM is emphasized when accurate conclusions about both the local charge density near the Fermi level, as provided by the STM channel, and the sitespecific strength of tip−sample interactions (NC-AFM channel) are desired. We conclude by generalizing to the case where multiple atomic-scale interactions are being probed while only one of them is kept constant. ■ INTRODUCTIONWith the accelerating trend toward miniaturization in functional electromechanical systems as well as the advent of twodimensional materials with exceptional physical properties such as graphene 1 and silica bilayers, 2 measuring and understanding chemical surface forces with atomic specificity has become increasingly important for fields as diverse as molecular electronics, catalysis, and tribology. 3 To image and characterize surfaces with atomic resolution, scanning tunneling microscopy (STM) 4 and noncontact atomic force microscopy (NC-AFM) 5 are most frequently used. While STM relies on the tunneling current between an atomically sharp probe tip and a (semi-) conducting sample to deliver atomic scale information about the electronic properties of surfaces, NC-AFM maps how much the resonance frequency f of an oscillating cantilever has changed from its value away from the surface (i.e., from its eigenf requency f 0 ) due to the chemical interaction forces acting between the tip and the sample (corresponding to the f requency shif t, Δf = f − f 0 ). Consequently, the concurrent recording of both the STM and the NC-AFM channel has in principle the potential to yield complementary information on both atomic scale variations in surface interactions and the underlying electronic structure responsible for them. However, using a combination of atomic-scale topography data acquired with tunneling current-based feedback and simultaneously recorded frequency shift images on surface oxidized Cu(100), we sho...

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Section: ■ Introductionmentioning

confidence: 99%

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

et al. 2015

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“…The curves are then [41] combined such that full three-dimensional maps of frequency shift ( f (x, y, z)) are formed that are subsequently converted to interaction force (F(x, y, z)) and energy (E(x, y, z)) maps [22].…”

Section: Experimental Methodologymentioning

confidence: 99%

“…Despite the remarkable success of NC-AFM in measuring the atomic-scale structure of surfaces as well as associated interaction forces/energies via 3D force field spectroscopy, an important but often overlooked shortcoming of the technique is the inadvertent effect of structural and chemical properties of the tip apex (such as tip asymmetry, elasticity or elemental composition) on acquired data [36,41,42,[48][49][50][51]. Since most tip apices used in 3D force field spectroscopy feature a certain degree of atomic-scale asymmetry at the very apex with respect to the surface due to the methods by which they are obtained, significant inconsistencies arise between different experiments performed on the same sample system by different research groups or even by the same research group on different occasions.…”

Section: Tip Asymmetrymentioning

confidence: 99%

“…2.3c). Force interactions between each tip and sample atom for the symmetric [41] and asymmetric tip apices are calculated using a 12-6 Lennard-Jones (L-J) model with appropriate parameters for Cu and Pt atoms as well as Lorentz-Berthelot mixing rules [41]. Finally, the total normal force interaction experienced by the tip is plotted as a function of lateral position and tip-sample distance along the [100] crystallographic direction via 2D maps of force on the (x, z) plane (Fig.…”

Section: Tip Asymmetrymentioning

confidence: 99%

“…Moreover, the technique frequently suffers from various artifacts related to thermal drift and piezo nonlinearities, as well as tip-related issues involving elasticity and asymmetry [41,42]. In this chapter, we will review the advantages and disadvantages of the particular methods proposed in the literature to perform 3D-AFM and analyze the effect of different artifacts on the measurements.…”

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3D Force Field Spectroscopy

Baykara

Schwarz

2015

Noncontact Atomic Force Microscopy

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With recent advances in instrumentation and experimental methodology, noncontact atomic force microscopy is now being frequently used to measure the atomic-scale interactions acting between a sharp probe tip and surfaces of interest as a function of three spatial dimensions, via the method of three-dimensional atomic force microscopy (3D-AFM). In this chapter, we discuss the different data collection and processing approaches taken towards this goal while highlighting the associated advantages and disadvantages in terms of correct interpretation of results. Additionally, common sources of artifacts in 3D-AFM measurements, including thermal drift, piezo nonlinearities, and tip-related issues such as asymmetry and elasticity are considered. Finally, the combination of 3D-AFM with simultaneous scanning tunneling microscopy (STM) is illustrated on surface-oxidized Cu(100). We conclude the chapter by an outlook regarding the future development of the 3D-AFM method.

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Characterization of Catalysts by Advanced Scanning Probe Microscopy and Spectroscopy

Sun

Zeng

2020

ChemCatChem

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Considering that there is a shortage of sustainable resources and that serious environmental issues need to be solved, the development of efficient catalysts has attracted a lot attention globally for energy saving and environmental improvement. In the last few decades, great progresses have been made in terms of fabrication and application of catalysts, however, systematic characterization with advanced technology and methods that enable researchers to have a detailed understanding of the catalysts’ properties and catalytic reactions, especially where an interface is present, are still limited. This Review focusses on the applications of advanced Scanning Probe Microscopy (SPM) and Spectroscopy techniques for the characterization of catalytic materials and their related reactions. A detailed description of advanced SPM and Spectroscopy techniques is introduced, followed by their applications in the characterization of surfaces and properties of common ordered catalytic materials including some coordination polymers and metal oxides. Various properties of these catalytic materials, such as conductivity, piezoelectricity, nanomechanics, photoresponse, and others, characterized by SPM and Spectroscopy are discussed. Subsequently, we introduce the high‐resolution imaging of chemical reactions and bond configuration by high‐resolution non‐contact Atomic Force Microscopy (NC‐AFM). Finally, the challenges involved in the development of SPM and Spectroscopy and an outlook for future research are presented. This Review provides fundamental insights into the characterization of heterogeneous catalysts and viewpoints to the development of smart catalytic materials.

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Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Cited by 26 publications

References 65 publications

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

Simultaneous Measurement of Multiple Independent Atomic-Scale Interactions Using Scanning Probe Microscopy: Data Interpretation and the Effect of Cross-Talk

3D Force Field Spectroscopy

Characterization of Catalysts by Advanced Scanning Probe Microscopy and Spectroscopy

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