2000
DOI: 10.1002/sca.4950220201
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Proceedings of SCANNING 2000 May 9–12, 2000 San Antonio, Texas, USA

Abstract: The layer sequence of multilayered white and off-white paint chips is sometimes difficult to discern when utilizing commonly employed microscopical methods. This layer sequence information becomes vitally important when comparing a questioned paint sample to a paint sample of known origin. Techniques such as reflected light microscopy, fluorescence microscopy, and scanning electron microscopy (SEM) coupled with energy dispersive x-ray spectrometry (EDS) may not provide the needed discrimination. The elemental … Show more

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“…The reflected light is collected by an infinity-corrected optical system, composed of a 10Â objective and a tube lens, whose resolution is 0.84 m. The collected light is detected by a charge-coupled device (CCD) camera and BAM images are analyzed by the Lispix software. 31)…”
Section: Methodsmentioning
confidence: 99%
“…The reflected light is collected by an infinity-corrected optical system, composed of a 10Â objective and a tube lens, whose resolution is 0.84 m. The collected light is detected by a charge-coupled device (CCD) camera and BAM images are analyzed by the Lispix software. 31)…”
Section: Methodsmentioning
confidence: 99%