2013
DOI: 10.1117/12.2025142
|View full text |Cite
|
Sign up to set email alerts
|

Process-induced inhomogeneities in higher asymmetry angle x-ray monochromators

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2015
2015
2018
2018

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 10 publications
0
2
0
Order By: Relevance
“…The very important parameter of highly asymmetric monochromators as image magnifiers is the crystal surface quality, because the long-range surface undulations 9 deteriorate the final image quality. 8,19 We are also developing the surface processing technologies which can solve the problematic preparation of channel-cut monochromators and consequently allow the production of surfaces of such quality as those prepared by the conventional planar technology. We have applied advanced nanomachining using single-point diamond turning (SPDT) to prepare the crystal surfaces and using several finishing methods including conventional mechanical lapping, chemical polishing, and chemomechanical polishing.…”
Section: Introductionmentioning
confidence: 99%
“…The very important parameter of highly asymmetric monochromators as image magnifiers is the crystal surface quality, because the long-range surface undulations 9 deteriorate the final image quality. 8,19 We are also developing the surface processing technologies which can solve the problematic preparation of channel-cut monochromators and consequently allow the production of surfaces of such quality as those prepared by the conventional planar technology. We have applied advanced nanomachining using single-point diamond turning (SPDT) to prepare the crystal surfaces and using several finishing methods including conventional mechanical lapping, chemical polishing, and chemomechanical polishing.…”
Section: Introductionmentioning
confidence: 99%
“…The prepared optical elements are to be used for the hard X-ray radiation with the aim to increase diffraction efficiency and intensity throughput either in Laue transmission or Bragg reflection geometry. A perfect surface planarity and reduced roughness is of paramount importance in advanced X-ray metrology or X-ray imaging applications in which the angle of incident or diffracted X-ray beams are very low such as in grazing incidence monochromators or X-ray magnifiers [2,3].…”
Section: Introductionmentioning
confidence: 99%