2003
DOI: 10.1002/qre.521
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Process monitoring for correlated gamma‐distributed data using generalized‐linear‐model‐based control charts

Abstract: A model-based scheme is proposed for monitoring multiple gamma-distributed variables. The procedure is based on the deviance residual, which is a likelihood ratio statistic for detecting a mean shift when the shape parameter is assumed to be unchanged and the input and output variables are related in a certain manner. We discuss the distribution of this statistic and the proposed monitoring scheme. An example involving the advance rate of a drill is used to illustrate the implementation of the deviance residua… Show more

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Cited by 60 publications
(38 citation statements)
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“…Skinner et al (2003) e Jearkpaporn et al (2003) propuseram o uso de gráficos de controle para resíduos deviance dos MLGs no monitoramento de contagem de não-conformidades com distribuição Poisson e Gama, respectivamente. Russo et al (2008) usou o MLG para o monitoramento do número de não-conformidades em tecidos, seguindo uma distribuição Poisson.…”
Section: Modelos De Regressão Linear Múltiplaunclassified
“…Skinner et al (2003) e Jearkpaporn et al (2003) propuseram o uso de gráficos de controle para resíduos deviance dos MLGs no monitoramento de contagem de não-conformidades com distribuição Poisson e Gama, respectivamente. Russo et al (2008) usou o MLG para o monitoramento do número de não-conformidades em tecidos, seguindo uma distribuição Poisson.…”
Section: Modelos De Regressão Linear Múltiplaunclassified
“…In this context, various approaches have been proposed by researchers for constructing of control charts for autocorrelated data [10,11,12,13,14]. Alwan and Roberts [15] propose a univariate control chart for autocorrelated data.…”
Section: Introductionmentioning
confidence: 99%
“…Generalized linear models (GLMs) are effective in analyzing attribute data and have been applied to monitor processes, e.g., Hansen and Thyregod 21 , Jearkpaporn et al 22 , Tu and Piegorsch 23 and Skinner et al 24,25 . Such a wide application indicates that GLM can enhance the effectiveness of gauge capability analysis in environments in which variables are exponential family distributions.…”
Section: Introductionmentioning
confidence: 99%