Process-parameter optimization of Sb2O3 films in the ultraviolet and visible region for interferometric applications

Structural, mechanical and opto-thermal properties of non-crystalline SbxOy thin films

“…Among them Sb 2 O 3 and Sb 2 O 4 which have a high-efficiency flame-retardant synergist power in plastics, paints and could be used with other oxides as a catalyst for hydrocarbon cracking and hydrogen reduction, and in the production of ceramic enamels [1,2]. Also, they are used as wonderful ultraviolet filters for interferometric applications and present extended infrared transmission [3][4][5].…”

Micro- and nanostructures of Sb2O3 grown by evaporation–deposition: Self assembly phenomena, fractal and dendritic growth

“…One of these materials is antimony trioxide Sb 2 O 3 which is used as UV filter, flame retardant, catalyst and in other applications [1]. As a material with high refractive index, it is also of potential interest in optical and optoelectronic devices as it has been shown in Sb 2 O 3 films [2]. Recently, antimony based glasses and nano glass-ceramics containing Sb 2 O 3 were also proposed as promising materials for optical applications because of their wide optical band gap, low melting point, low phonon-energy and high refractive index [3].…”

Spectral Characteristics of an Inhomogeneous Film 2. Determination of Refractive Index Profile from Reflectance/Transmittance Spectrum

“…Various optimization techniques have been used for thin film multilayer design, such as the classic N-squared scanning technique and the global search technique, the Powell minimization algorithm, the Marquardt regression algorithm and the Simplex technique (16). Sahoo et al (8)(9)(10)(11)(12) and Tikhonravov et al (13) have used sophisticated techniques like the needle optimization technique. Among the commonly used and readily available optimization techniques, it has been found that the Marquardt regression algorithm is usually very fast in converging to a satisfactory solution and so this algorithm has been used here.…”

“…The inhomogeneous film model, with the relative variation in the film refractive index from air to substrate interfaces as determind above, has been used along with a model for the dispersive refractive index and extinction coefficient in the dispersive spectral region (400-900 nm), to fit the calculated reflectance values at different wavelengths with the measured values by a Marquardt regression algorithm based constrained optimization procedure. Following earlier studies (8)(9)(10)(11)(12), we have adopted the following models for the refractive index n f and extinction coefficient k f as functions of wavelength : These six optimization parameters are used in the optimization procedure to determine the variation of film refractive index and extinction coefficient with wavelength in the region 400-900 nm. The possible ranges of values of these parameters have to be constrained within certain limits to obtain realistic values ofnf and kr The relative refractive index ratios of the different film sub-layers (as determined in sec.…”

“…Some researchers have used a linear film refractive index profile and an optimization routine to determine the film's refractive index and extinction coefficient, as well as their dispersion with wavelength (7), but there are fairly large uncertainties in the values of the determined parameters. Other researchers have used sophisticated and complex curve-fitting optimization techniques like needle optimization for this purpose (8)(9)(10)(11)(12)(13). In this paper, we have only used well-known optimization techniques whose software is readily available.…”