2014
DOI: 10.1016/j.cie.2014.02.006
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Process yield analysis for autocorrelation between linear profiles

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Cited by 25 publications
(18 citation statements)
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“…Wang and Tamirat [5] derived the following process yield index for autocorrelation between linear profiles. This index is used to describe the relationship between manufacturing specifications and actual process yield.…”
Section: Yield Index For Autocorrelation Between Linear Profilesmentioning
confidence: 99%
See 3 more Smart Citations
“…Wang and Tamirat [5] derived the following process yield index for autocorrelation between linear profiles. This index is used to describe the relationship between manufacturing specifications and actual process yield.…”
Section: Yield Index For Autocorrelation Between Linear Profilesmentioning
confidence: 99%
“…Furthermore, [5] derived the asymptotic normal distribution of index ;AR (1) , which is given as follows:…”
Section: Yield Index For Autocorrelation Between Linear Profilesmentioning
confidence: 99%
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“…Recently, many studies have proposed different approaches in order to overcome this problem. For example, Chou et al, [24] Chen and Chen, [25] and Wang and Tamirat [26] used the sampling distribution of PCIs to derive an approximate lower confidence limit (LCL) of PCIs. Tong and Chen [27] and Pearn and Wu [28] applied a bootstrap approach to compute the LCLs of the PCIs.…”
Section: Introductionmentioning
confidence: 99%