2020
DOI: 10.1016/j.surfcoat.2020.125465
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Processing and characterization of a multibeam sputtered nanocrystalline CoCrFeNi high-entropy alloy film

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Cited by 46 publications
(40 citation statements)
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“…The concentration maps are shown in Figure 3 , in which the atomic percentages between the studied points were estimated by interpolation using the contour plot with layer boundaries function in the software Origin. It should be noted that the mapping of the concentrations of the constituents was performed for another Co-Cr-Ni-Fe film in our previous paper [ 11 ]. That sample was processed under the same PVD conditions, and the chemical composition map was obtained on the whole disk by X-ray fluorescence (XRF) spectroscopy.…”
Section: Resultsmentioning
confidence: 99%
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“…The concentration maps are shown in Figure 3 , in which the atomic percentages between the studied points were estimated by interpolation using the contour plot with layer boundaries function in the software Origin. It should be noted that the mapping of the concentrations of the constituents was performed for another Co-Cr-Ni-Fe film in our previous paper [ 11 ]. That sample was processed under the same PVD conditions, and the chemical composition map was obtained on the whole disk by X-ray fluorescence (XRF) spectroscopy.…”
Section: Resultsmentioning
confidence: 99%
“…These attributes of the instrument led to a gradient of chemical composition in the sample. A more detailed description of this PVD method has been published elsewhere [ 11 ]. The substrate was a Si single crystal with a diameter of 10 cm.…”
Section: Methodsmentioning
confidence: 99%
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