Production of highly charged argon ions from a room temperature electron beam ion trap

Abstract

In this work, highly charged ions have been extracted from the advanced Electron Beam Ion Source (EBIS-A) developed in a scientific cooperation between the Dresden University of Technology and the DREEBIT GmbH Dresden. The charge state distributions of ions extracted from the EBIS-A are measured in the pulse and leaky modes under different operation conditions. Ar 16+ ions with current of 2 pA are produced and extracted in the leaky mode. 3×10 5 Ar 18+ ions per pulse are extracted in the pulse mode. The ion charge state distribution is a function of the ionization time.