2000
DOI: 10.1063/1.1150593
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Production of metal oxide thin films by pulsed arc molecular beam deposition

Abstract: Deposition for the first time of titanium oxide, cerium oxide, and tin oxide thin films by reactive pulsed arc molecular beam deposition is reported. To produce these thin films, oxygen gas was pulsed between a pair of electrodes situated within a vacuum chamber. A 20 μf storage capacitor was discharged between the electrode pair during the gas pulse. A substrate was placed inline with the oxygen pulse, on which an oxide coating of the electrode material was then coated. The films were analyzed by both scannin… Show more

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Cited by 9 publications
(5 citation statements)
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“…The design and theory of the PAMBD process employed in this work have been described in detail elsewhere; therefore, only a brief description of the PAMBD operating mechanism will be given here. A schematic drawing of the PAMBD source is shown in Figure . ,
1 Schematic drawing of PAMBD source.
…”
Section: Experimental Methodsmentioning
confidence: 99%
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“…The design and theory of the PAMBD process employed in this work have been described in detail elsewhere; therefore, only a brief description of the PAMBD operating mechanism will be given here. A schematic drawing of the PAMBD source is shown in Figure . ,
1 Schematic drawing of PAMBD source.
…”
Section: Experimental Methodsmentioning
confidence: 99%
“…A schematic drawing of the PAMBD source is shown in Figure 1. 23,24 The ZnO thin film starting materials are a reactive gas, O 2 , and a pair of conducting high-purity Zn electrodes. In the PAMBD process prior to triggering the discharge, the gas is pulsed between the ends of a pair of cylindrical electrodes.…”
Section: Experimental Methodsmentioning
confidence: 99%
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