1984
DOI: 10.1007/bf01438357
|View full text |Cite
|
Sign up to set email alerts
|

Production of projectile and targetK X-rays by single and multiple electron-capture in collisions of Si14+ and Si13+ ions with argon atoms at 4.5 and 5.5 MeV/amu

Abstract: Projectile and target X-ray cross-sections have been measured in collisions of bare and hydrogenlike Silicon ions with argon atoms. Projectile energies are 125MeV and 153 MeV, i.e. the intermediate velocity region for K-shell capture. Coincidence measurements between X-ray photons and the scattered Si "+ projectiles with charge states n-1, n-2 and n-3 have been made. The relative contribution of charge exchange and direct ionization (or excitation) of the target K-shell has been obtained directly by this new m… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

1
2
0

Year Published

1985
1985
1995
1995

Publication Types

Select...
5
2
1

Relationship

1
7

Authors

Journals

citations
Cited by 13 publications
(3 citation statements)
references
References 17 publications
1
2
0
Order By: Relevance
“…Similar charge multiplication effects caused by Auger decay of L vacancies have been observed in collisons of 1-MeV/amu 0 and F ions with Ar [12]. The dominant mechanism for K-vacancy production in the Ar' ++CO collision system is electron capture to the Ar L shell [13]. However, this same mechanism must also contribute to the Ne results.…”
Section: Resultssupporting
confidence: 60%
“…Similar charge multiplication effects caused by Auger decay of L vacancies have been observed in collisons of 1-MeV/amu 0 and F ions with Ar [12]. The dominant mechanism for K-vacancy production in the Ar' ++CO collision system is electron capture to the Ar L shell [13]. However, this same mechanism must also contribute to the Ne results.…”
Section: Resultssupporting
confidence: 60%
“…The only previous report of the cross section for multiple-electron capture being larger than that for single-electron capture, determined by ion-x-ray coincidence, is the observation of double K-to-K transfer in collisions of bare 4.5-MeV /u Si ions in Ar. 12 The results of reference 11 were recently extended to measure capture of up to eight electrons, and the projectile velocity has been varied.l3 New results are presented here for varying the projectile charge state, which varies the number of initial vacancies in the projectile L shell.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, Belkic et al [10] extended the method of obtaining the CDW electron capture cross section for transitions between arbitrary subshells of an atom. Subsequently, this extended CDW approximation has been used by Andriamonje et al [11] in a detailed evaluation of the cross section for electron capture from the L-shell to L and M-shells in Siq+-Ar collision, with the charge state q = 13 and 14.…”
Section: 70mentioning
confidence: 99%