Profile analysis on the basis of the energy-dispersive spectra at high pressure and temperature using synchrotron radiation

Yamanaka, Toshiro; Ogata, K.

doi:10.1107/s0108767387078425

Acta Cryst Sect A

1987

DOI: 10.1107/s0108767387078425

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Profile analysis on the basis of the energy-dispersive spectra at high pressure and temperature using synchrotron radiation

Toshiro Yamanaka¹,

K. Ogata²

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Profile analysis on the basis of the energy-dispersive spectra at high pressure and temperature using synchrotron radiation

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