“…Yet, these methods have limitations in capturing the complete chemical and electronic structure of single-layer GO. To address this, the authors employed conductive atomic force microscopy (C-AFM) to simultaneously visualize the mechanical and electrical properties of single-layer GO, revealing distinct domain structures determined by the prevalence of sp 2 -or sp 3 -carbon regions. The study emphasizes the heterogeneous conductivity of singlelayer GO at the nanoscale, highlighting the significance of the chemical composition, particularly oxygen density, in determining its properties.…”