IEEE Trans. Electron Devices
 2020
DOI: 10.1109/ted.2020.2998099
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Prolonged Transient Behavior of Ultrathin Oxide MIS-Tunneling Diode Induced by Deep Depletion of Surrounded Coupling Electrode

Tzu-Chien Hsu
1
,
Jenn–Gwo Hwu
2
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