Propagation of light in quasi-regular dielectric heterostructures with delta-like layers

Agarwal, Vivechana; Urueta, Jose A. Soto

doi:10.1016/j.mejo.2005.02.034

Cited by 11 publications

(6 citation statements)

References 8 publications

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“…with k = 2π/λ, where λ is the optical wavelength of the normally incident radiation. The solution for the multilayered structure is sought via the construction of a particular transfer matrix [34,46]. Due to the discontinuity posed by the delta function upon the first derivative of the electric field, the elements of the transfer matrix corresponding to each building block are given by…”

Section: Theoretical Model For Delta Structuresmentioning

confidence: 99%

“…Optical properties of TM 1D dielectric systems have also been studied by some authors [25][26][27][28][29][30][31][32][33][34]. Liu investigated the effects of the modulation in both the refractive index and optical thickness in the structure [25].…”

Section: Introductionmentioning

confidence: 99%

“…Dielectric quasiregular heterostructures including deltalike profiles for FN, TM and period doubling sequences were advanced by Mora-Ramos et al [34]. More recently, light propagation in porous silicon TM systems was presented in [35,36].…”

Section: Introductionmentioning

confidence: 99%

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Optical characterization of polytype Fibonacci and Thue–Morse quasiregular dielectric structures made of porous silicon multilayers

Agarwal

2007

J. Phys. D: Appl. Phys.

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To investigate the reflection of light in quasiregular dielectrics, we study here the optical properties of porous-silicon-based Fibonacci and Thue–Morse heterostructures. The multilayered systems are fabricated in such a way that each element in the two-block substitutional sequence has a polytype structure. Both delta-like and traditional configurations are considered. The results for the optical reflectance are analysed. Numerical simulation for the transmittance of delta structures along the lines of the transfer matrix approach is also presented.

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Section: Theoretical Model For Delta Structuresmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Optical characterization of polytype Fibonacci and Thue–Morse quasiregular dielectric structures made of porous silicon multilayers

Agarwal

2007

J. Phys. D: Appl. Phys.

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“…Some previous works on FN and TM dielectric heterostructures based on porous silicon have been put forward [13][14][15][16][17][18]. In the case of the PD sequence, only very scarce reports are found regarding the analysis of the optical transmission of dielectric multilayers [16,19].…”

Section: Introductionmentioning

confidence: 99%

Optical Properties of Non-Periodic Dielectric Systems Made of Nanostructured Porous Silicon

Tenorio

Escorcia‐García

Agarwal

2009

JNanoR

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To investigate the optical properties in non-periodic dielectric systems, we study here the reflection of light from nanostructured porous-silicon-based period doubling heterostructures. The multilayered systems are fabricated in such a way that the optical thickness of each layer is one quarter of 650nm. The results for the optical reflectance are presented and compared with that of Fibonacci, Thue-Morse, and random structures fabricated under the same conditions. Numerical simulation for the reflectance along the lines of the transfer matrix approach is performed. In addition, optical reflection from Gaussian porous silicon multilayers is also briefly discussed. We find that porous silicon Period Doubling dielectric multilayers could demonstrate the optical properties similar to the classical periodic Febry-Perot interference filters with one or multiple resonant peaks, but with an advantage of having total optical thickness much lesser than that of the periodic structures.

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“…The lower-orders of the Thue-Morse sequence are: S 0 =A, S 1 =AB, S 2 =ABBA, S 3 =ABBABAAB, S 4 =ABBABAABBAABABBA, and so on. Dielectric Thue-Morse multilayers have been already demonstrated using Si/SiO 2 and TiO 2 /SiO 2 as high/low refractive index materials [5,6] and recently also in porous silicon (PSi) [7]. In this study we have fabricated and characterized the Thue-Morse S 0 -S 7 sequences by using the PSi technology.…”

Section: Introductionmentioning

confidence: 99%

Optical properties of porous silicon Thue‐Morse structures

Stefano

Rea

Rotiroti

et al. 2007

Phys. Status Solidi (c)

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Dielectric aperiodic Thue-Morse structures up to 128 layers have been realized by the porous silicon technology. Normal incidence reflectivity measurements have been performed to investigate the photonic properties of the devices. A partial photonic band gap region, centered at 1100 nm and 70 nm wide has been observed for the S 6 and S 7 Thue-Morse structures. The S 6 multilayer has been studied as sensor device on exposure to several chemical substances.

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Propagation of light in quasi-regular dielectric heterostructures with delta-like layers

Cited by 11 publications

References 8 publications

Optical characterization of polytype Fibonacci and Thue–Morse quasiregular dielectric structures made of porous silicon multilayers

Optical characterization of polytype Fibonacci and Thue–Morse quasiregular dielectric structures made of porous silicon multilayers

Optical Properties of Non-Periodic Dielectric Systems Made of Nanostructured Porous Silicon

Optical properties of porous silicon Thue‐Morse structures

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