Properties of a-C:H films grown in inert gas ambient with camphoric carbon precursor of pulsed laser deposition

Rusop, M.; Mominuzzaman, Sharif Mohammad; Soga, Tetsuo; Jimbo, Takashi

doi:10.1016/j.diamond.2004.07.008

Cited by 2 publications

(2 citation statements)

References 41 publications

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“…These sharp edges were very clearly seen in C700, C800 and C900. These sharp features are very much similar to that observed for DLC films (Rusop et al 2004). So we believe that these sharp edges formed are in the early stages of diamond formation.…”

Section: Resultssupporting

confidence: 85%

Structural morphology of amorphous conducting carbon film

et al. 2005

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Amorphous conducting carbon films deposited over quartz substrates were analysed using X-ray diffraction and AFM technique. X-ray diffraction data reveal disorder and roughness in the plane of graphene sheet as compared to that of graphite. This roughness increases with decrease in preparation temperature. The AFM data shows surface roughness of carbon films depending on preparation temperatures. The surface roughness increases with decrease in preparation temperature. Also some nucleating islands were seen on the samples prepared at 900°C, which are not present on the films prepared at 700°C. Detailed analysis of these islands reveals distorted graphitic lattice arrangement. So we believe these islands to be nucleating graphitic. Power spectrum density (PSD) analysis of the carbon surface indicates a transition from the nonlinear growth mode to linear surface-diffusion dominated growth mode resulting in a relatively smoother surface as one moves from low preparation temperature to high preparation temperature. The amorphous carbon films deposited over a rough quartz substrate reveal nucleating diamond like structures. The density of these nucleating diamond like structures was found to be independent of substrate temperature (700-900°C).

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Section: Resultssupporting

confidence: 85%

Structural morphology of amorphous conducting carbon film

et al. 2005

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“…Therefore the microwave assisted synthesis (MAOS) [23] is a cost-effective alternative technology which reduces the impact on the environment by saving energy, being able to produce materials and microstructures that cannot be performed by other methods [24]. The synthesis of carbon films using camphor has already some history with not very clear results about the crystal structure of the same and the method of synthesis [20,[25][26][27][28], and we believe that it is still a very attractive study and control method variety. The aim of this work was to find the synthesis and microstructural characterization of the carbon films by microwave radiation using the techniques such as X-ray diffraction, scanning electron microscope, high-resolution transmission electron microscopy, and atomic force microscopy.…”

Section: Introductionmentioning

confidence: 99%

Large Area C₆₀ Film Obtained by Microwave Oven Irradiation from an Organic Resin

Martínez-Reyes¹,

Barriga-Arceo²,

Rendón-Vázquez³

et al. 2013

ISRN Nanomaterials

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In the present work the synthesis of fullerene thin film produced in a conventional microwave oven from the decomposition of terpenoid is reported. The polycrystalline structure of the sample was determined by X-ray diffraction (XRD); the sample showed several phases, and the main phase corresponds to fullerene ordered in a face-centered cubic structure (FCC), with a lattice parameter a=14.16 Å, with two more structures: one is orthorhombic system with lattice parameters a=9.53 Å, b=8.87 Å, and c=8.354 Å, and the other is the monoclinic system with lattice parameters a=10.24 Å, b=7.80 Å, c=9.49 Å, and β=92.4° coexisting also with graphite 2H phase with lattice parameters a=2.46 Å, c=6.71 Å. It was observed in a scanning electron microscopy (SEM) that the sample formed thin films of stacked carbon. The film thickness was measured by a SEM, and it was 140.8 to 523 nm and the macroscopic area of 12 cm2, whereas a high-resolution transmission electron microscopy (HRTEM) revealed that the main phase of the material is C60 ordered in a face-centered cubic structure (FCC). In the sample surface by atomic force microscopy (AFM), islands deposited crystals were observed having symmetry 4-3m crystal habit associated with the tetrahedron.

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Properties of a-C:H films grown in inert gas ambient with camphoric carbon precursor of pulsed laser deposition

Cited by 2 publications

References 41 publications

Structural morphology of amorphous conducting carbon film

Structural morphology of amorphous conducting carbon film

Large Area C₆₀ Film Obtained by Microwave Oven Irradiation from an Organic Resin

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Properties of a-C:H films grown in inert gas ambient with camphoric carbon precursor of pulsed laser deposition

Cited by 2 publications

References 41 publications

Structural morphology of amorphous conducting carbon film

Structural morphology of amorphous conducting carbon film

Large Area C60 Film Obtained by Microwave Oven Irradiation from an Organic Resin

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Large Area C₆₀ Film Obtained by Microwave Oven Irradiation from an Organic Resin