2009
DOI: 10.1016/j.tsf.2009.03.075
|View full text |Cite
|
Sign up to set email alerts
|

Properties of CuS thin films treated in air plasma

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

4
17
1

Year Published

2010
2010
2023
2023

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 47 publications
(22 citation statements)
references
References 21 publications
4
17
1
Order By: Relevance
“…The observed increase in electrical resistivity with an increment in the Sn/Cu molar ratio from 0.2 to 0.6 (except the CTS3 sample) could be associated with a decrease in the crystallite size (table 2) and with copper-poor conditions in the samples. Similar observations have been reported in literature [19][20][21].…”
Section: Investigation Of Electrical Conduction Mechanisms Of Cts Samsupporting
confidence: 92%
See 1 more Smart Citation
“…The observed increase in electrical resistivity with an increment in the Sn/Cu molar ratio from 0.2 to 0.6 (except the CTS3 sample) could be associated with a decrease in the crystallite size (table 2) and with copper-poor conditions in the samples. Similar observations have been reported in literature [19][20][21].…”
Section: Investigation Of Electrical Conduction Mechanisms Of Cts Samsupporting
confidence: 92%
“…According to [19][20][21] in polycrystalline semiconductors, the electrical resistivity of samples increases with a decrease in the crystallite size due to a decrease in charge carrier mobility. Furthermore, from figure 3 it was observed that two regions with different slopes in the plot suggest the presence of two different conduction mechanisms in the investigated temperature range.…”
Section: Investigation Of Electrical Conduction Mechanisms Of Cts Sammentioning
confidence: 99%
“…8. It is evident that the trend of the hole mobility variations is consistent with the crystallite size variations (Table 1) which is in harmony with the report of Rodriguez-Lazcano et al [20]. Also it is clear that, while the substrate temperature of the samples increases, (1) the degenerate hole density gradually increases from *2.76 9 10 18 cm -3 to about 4.19 9 10 18 cm -3 ; and (2) the resistivity decreases from 0.064 to 0.032 X cm in PV260-PV335.…”
Section: Electrical Studysupporting
confidence: 91%
“…Copper sulfide (Cu x S) was an extensively studied material in respect to solar cells in the 60s and 70s of the last century [1]. It is an abundant compound with almost a dozen of phases which crystallize with stoichiometries ranging from x=1 (covellite) to x=2 (chalcocite) and with band gaps covering the 1.3-2.4 eV range [2][3][4]. Its application in the field of photovoltaics was hindered through the relatively high degradation rate of the Cu x S/CdS interface (CdS served as a window layer for the p-n junction) and the Cu x S absorber [5].…”
Section: Introductionmentioning
confidence: 99%