1999
DOI: 10.1016/s0169-4332(98)00685-0
|View full text |Cite
|
Sign up to set email alerts
|

Properties of metal bolometers fabricated on porous silicon

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

1
6
1

Year Published

2001
2001
2016
2016

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 14 publications
(8 citation statements)
references
References 7 publications
1
6
1
Order By: Relevance
“…With such a high bandwidth, we could discard that the observed responsivity is due to thermal (bolometric) processes, 4 since this kind of processes have strong frequency dependence and quite long response time, determined by the thermal mass and thermal diffusivity of the material. 4,37 This observation is in contrast with the low-temperature sub-band gap photoresponse previously reported in S supersaturated Si, where the sub-band gap photoresponse of the S supersaturated device is reported to have a strong thermal component. 12 Measurement of the S n for the Ti supersaturated Si devices is shown and discussed in the supplementary material, 38 showing a 1/f 1 =2 -like noise behavior at lower frequencies and a white noise behavior at higher frequencies.…”
contrasting
confidence: 73%
“…With such a high bandwidth, we could discard that the observed responsivity is due to thermal (bolometric) processes, 4 since this kind of processes have strong frequency dependence and quite long response time, determined by the thermal mass and thermal diffusivity of the material. 4,37 This observation is in contrast with the low-temperature sub-band gap photoresponse previously reported in S supersaturated Si, where the sub-band gap photoresponse of the S supersaturated device is reported to have a strong thermal component. 12 Measurement of the S n for the Ti supersaturated Si devices is shown and discussed in the supplementary material, 38 showing a 1/f 1 =2 -like noise behavior at lower frequencies and a white noise behavior at higher frequencies.…”
contrasting
confidence: 73%
“…Since then, PS was widely studied from the viewpoint of a luminescent material [2] as well as buried waveguides [3], antireflective coatings for silicon-based solar cells [4] and gas sensors [5]. In recent years, it was reported that PS formed on single crystalline silicon acts as an ultrasonic emitter [6,7] as well as a heat insulation layer [8]. We applied PA spectroscopy to the estimation of the thermal conductivity of PS in the depth direction.…”
Section: Introductionsupporting
confidence: 91%
“…The reference data for the bulk samples (Table 1) differ by several times [4]. In particular, the obtaining of Nb films several tens of nanometers in thickness leads to the decrease in TCR (2-3 times), and the electrical resistivity increases approximately by 2-3 times [8], [16]. Therefore, to compare the sensitivity of the bolometers according to Eq.…”
Section: Estimationsmentioning
confidence: 99%