2009
DOI: 10.1016/j.intermet.2008.11.020
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Properties of nanocrystalline and nanocomposite WxZr1−x thin films deposited by co-sputtering

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Cited by 18 publications
(9 citation statements)
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“…The electrical resistivity values of the optimum CMTS thin films are near to the values of CZTS thin films doped Al obtained by Gadallah et al [52]. The slow decrease of the electrical resistivity is favored by the crystallinity improvement such as the crystallite growth [53], and also by the higher metal enrichment due to the sulfur loss with the temperature increases. Referring to Figure 2b, the band gap energies of the films were deduced by extrapolating the linear portion of the plots to the photon energies axis.…”
Section: Electrical Characterizationsupporting
confidence: 70%
“…The electrical resistivity values of the optimum CMTS thin films are near to the values of CZTS thin films doped Al obtained by Gadallah et al [52]. The slow decrease of the electrical resistivity is favored by the crystallinity improvement such as the crystallite growth [53], and also by the higher metal enrichment due to the sulfur loss with the temperature increases. Referring to Figure 2b, the band gap energies of the films were deduced by extrapolating the linear portion of the plots to the photon energies axis.…”
Section: Electrical Characterizationsupporting
confidence: 70%
“…It appeared as a singularity in the optical properties within the explored compositions in sputtered Zr-Mo thin film [22]. A similar situation was observed in Zr-W thin films [23] and, as will be shown, in the case of Ti-O films, suggesting that a general process could be in action, detectable only with very precise variation of the chemical composition.…”
Section: Introductionsupporting
confidence: 66%
“…Nevertheless, this is not something particular for the Zr-Mo system. For example, in sputter-deposited Zr-W thin films, a transition from the amorphous to the crystalline phase was also observed [23]. This transition is illustrated in the X-ray diffractograms shown in Fig.…”
Section: Towardsmentioning
confidence: 80%
“…Furthermore, an anomaly of the deposition rate can be observed in a short range of setpoint between 7 about 67.5 to 75 %. It was already reported that the deposition rate analysis can give evidence of structural changes [46], thus some structural and/or microstructural events could then be expected. preferential orientation of the magnetite phase is observed at low incidence angle and setpoint (77.5 %), while the phase crystallizes along to the [311] direction by increasing the setpoint and the incidence angle.…”
Section: Deposition Rate Of Feox Filmsmentioning
confidence: 94%