Properties of piezoelectric ceramics in the solid-solution series lead titanate-lead zirconate-lead oxide: Tin oxide and lead titanate-lead hafnate

Abstract

Co mpositional proximity to a morphotropic t ransformation between two ferroelectric solid-s olution phases seems to yie ld ceramic transducers having desirable properties over a wide range of te mperature. Examples of t his phenomenon were observed in the systems PbTi03-PbZr03, PbTi03-PbO:Sn02, PbTi03-PbZr03-PbO:SnO" and PbTi03-PbHf03. The dielectric and piezoelectric properties of ceramics having compos itions in these syste ms and in t he system PbZr03-PbO:Sn02 are described .The composition Pb (Ti .. 5Zr .5,) 0 3 ex hibits a high radial coupli ng coefficient, greater than 0.3, for temperatures a s high as 275 0 C and has t he highest g31 constant, 1l .7 X 10-3 volt -meters per ne\\·toll. For the ser ies of compos itions containing 30 perce nt PbO:SnO, in the ternary system PbTi03-PbZr03-PbO:Sn02 the tetragonal composition nearest the morphotropic boundary has the highes t d31 value, 74 X 10-12 coul ombs per newton . The rhombohedral composition nea rest. the morphotropic boundary sho\\'s the least change of fr equenc y co nstant with temperature, a 2 perce nt variat io n over t he ra nge of 25 0 to 225 0 C.

In-plane orientation and composition dependences of crystal structure and electrical properties of {100}-oriented Pb(Zr,Ti)O3films grown on (100) Si substrates by metal organic chemical vapor deposition

“…The maximum value was obtained near Zr= (Zr + Ti) = 0.50 for the epitaxial PZT films, and this Zr= (Zr + Ti) ratio was almost the same as that for bulk ceramics. 1,28) The ε r of the fiber-textured PZT films showed maximum at Zr=(Zr + Ti) = 0.57. This Zr=(Zr + Ti) ratio seems to be misaligned with the MPB one, but a more detailed investigation is essential to discuss the dependence of ε r on the Zr=(Zr + Ti) ratio owing to the lack of a sufficient amount of data.…”

“…In-plane orientation and composition dependences of crystal structure and electrical properties of {100}-oriented Pb(Zr,Ti)O 3 films grown on (100) Si substrates by metal organic chemical vapor deposition 1…”

Perturbed angular correlation study of 181Ta-doped PbTi1−xHfxO3 compounds

“…The fitted hyperfine parameters at RT are: CÜQ=85(2) Mrad/s, f/=0.41(5) and ¿ = 60(2)%. For this Ti concentration, previous studies [12][13] reported that the compound is in a rhombohedral Pbam ferroelectric phase from RT to about 270 °C (T c ), and in a cubic Pm3m paraelectric phase above this temperature. In the figure it can be seen that between 200 °C and 220 °C, the hyperfine parameters present an abrupt change, which should correspond to the previously reported first order phase transition but at a lower temperature.…”

“…In PTH the mix of the primary oxides PT and PH produces at room pressure a tetragonal structure for Ti rich compositions. But for x > 0.5 and below the Curie temperature (T c ) a rhombohedral structure that is not present in any of the two constituent oxides was observed [12]. At x=0.5, the coexistence of a monoclinic structure that is neither present in the pure oxides nor together with the rhombohedral structure has been reported [14].…”

“…The phase diagram of PTH has been previously studied [12][13][14]. For its determination, different experimental techniques were employed (Impedance Spectroscopy, Differential Scanning Calorimetric, Thermo Gravimetric Analysis, X-ray absorption fine structure (XAFS), X-ray and Neutron Powder Diffraction) [12][13][14][15][16][17]. In the literature there are some differences in the temperature at which the phase transitions occur.…”