Properties of the Optical Planar Polymer Waveguides Deposited on Printed Circuit Boards

Properties of Siloxane Based Optical Waveguides Deposited on Transparent Paper and Foil

“…Such new optical waveguides could be deposited onto transparent paper or foils and may have unique properties such us high transparency, low optical loss, suitable temperature stability and excellent flexibility/bendability. Also polymer materials for fabrication of flexible planar optical waveguides appeared to be a good choice for their excellent optical properties such as their high transparency from visible to infra-red wavelengths, well-controlled refractive indices, reasonable temporal and temperature stability, low optical losses, easy fabrication process and low costs [7][8][9][10][11][12][13]. Substrates play a key role for photonics devices, therefore integration of optical waveguides and opto-electronic components onto transparent paper and flexible foils introduces a new concept of optical interconnection and flexibility into the on-board optical communications [14], [15].…”

Properties of Multimode Optical Epoxy Polymer Waveguides Deposited on Silicon and TOPAS Substrate

“…Critical angles of incidence determine refractive indices of the waveguiding (EpoCore, n f ) and cladding (EpoClad, n s ) layers. For more details of such measurement see [11,16].…”

“…In developing the new approach, epoxy polymer was selected as a core waveguide material while EpoClad polymer material was selected for cladding; both supported by Micro resist technology GmbH. These materials possess excellent properties such as high heat and pressure resistance, low optical losses (< 0.49 dB•cm -1 at 633 nm [11,12], 0.2 dB•cm -1 at 850 nm, refractive index EpoCore 1.58, EpoClad 1.57, λ = 830 nm [13]), easy fabrication process, etc. For the substrate we used silicon and flexible TOPAS polymer foil 8007X4.…”

Impact of inorganic nanoparticles on optical properties of low refractive index waveguiding polymers

“…Optical losses of the planar waveguides were measured by a technique involving measurement of transmitted and scattered light intensity as a function of propagation distance along the waveguide [16]. This technique has been also used recently for the characterization of other polymer optical waveguides [17][18][19]. Temperature dependent ellipsometric measurements were carried out using a modified Sentech ellipsometer [20] with polymer films on Si substrates.…”