Effect of heterostructure design on current-voltage characteristics in AlxGa1−xN/GaN double-barriers resonant tunneling diode J. Appl. Phys. 112, 114305 (2012) Correlation between deep-level defects and turn-on recovery characteristics in AlGaN/GaN hetero-structures J. Appl. Phys. 112, 106103 (2012) Observation of the generation of stacking faults and active degradation measurements on off-axis and on-axis 4H-SiC PiN diodes Appl. Phys. Lett. 101, 222111 (2012) Reverse Schottky gate current in AlGaN-GaN high-electron-mobility-transistors J. Appl. Phys. 112, 094508 (2012) Additional information on J. Appl. Phys. In this work, we analyze electrically the Al/p-Si/[6,6] phenyl-C61 butyric acid methyl ester/Al hybrid heterojunction. The barrier height at the p-Si/PCBM interface corresponding to the difference between Si valence band edge and the lowest unoccupied molecular orbital energy level of PCBM is studied with current-voltage (J-V) and capacitance-voltage (C-V) methods and determined to be ' 0:55 eV. This value is in agreement with the onset energy of spectrally resolved photocurrent measurements presented in a previous publication [Matt et al., Adv. Mater. 22, 647 (2010)]. For the J-V characteristics, a thorough model based on an interface generation-recombination current is proposed. All relevant energy levels for this model are obtained experimentally. As origin of the large reverse current, the thermal generation of charge carriers throughout the Si depletion region is identified by the thermal activation measurements. V C 2012 American Institute of Physics.