1991
DOI: 10.1002/pssa.2211250138
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Properties of the Organic-on-Inorganic Semiconductor Barrier Contact Diodes In/PTCDI/p-Si and Ag/CuPc/p-Si

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Cited by 88 publications
(43 citation statements)
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“…The electrical properties of metal/semiconductor (MS) structures can be modified by organic semiconductors when an organic layer is inserted between the inorganic semiconductor and metal. The studies made in literature have shown that the barrier height could be either increased or decreased by using organic thin layer on inorganic semiconductor [1][2][3][4][5][6][7][8][9][10][11]. New electrical properties of the MS contacts can be promoted by means of the choice of suitable organic semiconductors [1].…”
Section: Introductionmentioning
confidence: 99%
“…The electrical properties of metal/semiconductor (MS) structures can be modified by organic semiconductors when an organic layer is inserted between the inorganic semiconductor and metal. The studies made in literature have shown that the barrier height could be either increased or decreased by using organic thin layer on inorganic semiconductor [1][2][3][4][5][6][7][8][9][10][11]. New electrical properties of the MS contacts can be promoted by means of the choice of suitable organic semiconductors [1].…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, most of the reported studies of semiconductor-small molecules hybrid cells are related to Pc and Ph compounds. In particular, pSi/CuPc [32], Si/ZnPc [33,34], nSi/MgPc [35], pSi/NiPc [36], nGaAs/CuPc [37] and nSi/TTP [38] ( Figure 2) hybrid solar cells were reported in literature with conversion efficiencies in the range of 1-3.5%. An additional advantage of phtalocyamines is their exceptional chemical stability.…”
Section: Semiconductor-small Molecules Solar Cellsmentioning
confidence: 74%
“…15,17,18 The same mechanism has been suggested as origin for the reverse current in organic/inorganic diodes on n-GaAs 19 and p-Si substrates. 20 According to Ref. 15, the generation current depends on the width of the depletion zone w Si and the intrinsic carrier density n i of the substrate semiconductor.…”
Section: Resultsmentioning
confidence: 99%