Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002
DOI: 10.1145/505306.505320
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Protected IP-core test generation

Abstract: Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct integration in a design implies more complex verification problems. IPs are usually provided with their own test patterns that can be used only by applying design for testability techniques onto the chip. Whenever physical faults must be detected, this approach is reasonable, even if it implies circuit performance degradation. However, it … Show more

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