2019
DOI: 10.3390/electronics8050519
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Proton Induced Single Event Effect Characterization on a Highly Integrated RF-Transceiver

Abstract: Radio frequency (RF) systems in space applications are usually designed for a single task and its requirements. Flexibility is mostly limited to software-defined adaption of the signal processing in digital signal processors (DSP) or field-programmable gate arrays (FPGA). RF specifications, such as frequency band selection or RF filter bandwidth are thereby restricted to the specific application requirements. New radio frequency integrated circuit (RFIC) devices also allow the software-based reconfiguration of… Show more

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Cited by 12 publications
(4 citation statements)
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“…The radiation tolerance was verified through SPICE simulations with radiation-aware transistor models. In [4], the authors presented the proton induced SEE characterization of a highly integrated RF transceiver in 65 nm CMOS. The exposed proton energies were split into two test campaigns to induce high energy protons (up to 184 MeV) and low energy protons down to 4 MeV.…”
Section: The Present Issuementioning
confidence: 99%
“…The radiation tolerance was verified through SPICE simulations with radiation-aware transistor models. In [4], the authors presented the proton induced SEE characterization of a highly integrated RF transceiver in 65 nm CMOS. The exposed proton energies were split into two test campaigns to induce high energy protons (up to 184 MeV) and low energy protons down to 4 MeV.…”
Section: The Present Issuementioning
confidence: 99%
“…In this test configuration the exchangeable RF daughterboard has been demounted to enable full access to the components of interest for the proton beam. Further investigations on the RF data in this test campaign have been skipped due to the radiation test results that have been obtained previously on a separated proton test, focusing only on the AD9361 [11]. The GSDR was running the same software (except the usage of a SD-card for intermediate data storage and collecting RF data) and the numbers of events were counted.…”
Section: Comparison To Proton-induced See Test Resultsmentioning
confidence: 99%
“…Even small increment of current over normal supplied current, the SEL will occur and may damage the systems overall. [16][17][18][19][20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%