Selected number of anti-diabetic medicinal plant leaves has been characterized by accelerator based particle-induced X-ray emission (PIXE) technique. Validity of the technique was assured by analyzing certified plant reference materials (CRMs). A large number of trace elements like Ti , V , Cr , Mn , Fe , Co , Ni , Cu , Zn , Rb , Sr and Pb are found to be present in these studied leaf samples with variable proportions. The concentrations of elements like K and Ca are quantified in percentage level whereas other elements are found to be in parts per million levels. Among the studied samples, the leaves of Methi are found to be containing maximum amount of trace elements.