2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) 2019
DOI: 10.1109/ipfa47161.2019.8984789
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Provocation tests, design of experiments and advanced statistical modeling to estimate product sensitivity to a defect: delamination failure case study for automotive semiconductors

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“…The execution of the experiment is aligned with this plan, leading to the collection and statistical analysis of the results. DoE equips system designers with the ability to discern the most influential variables, understand their interactions, and fine-tune the conditions to achieve optimal outcomes with minimal experimental iterations [17]. Complementing DoE, sensitivity analysis serves as a pivotal technique for examining how variations in the input parameters or model attributes influence the outputs or results [18].…”
Section: Sensitivity Analysis With Doementioning
confidence: 99%
“…The execution of the experiment is aligned with this plan, leading to the collection and statistical analysis of the results. DoE equips system designers with the ability to discern the most influential variables, understand their interactions, and fine-tune the conditions to achieve optimal outcomes with minimal experimental iterations [17]. Complementing DoE, sensitivity analysis serves as a pivotal technique for examining how variations in the input parameters or model attributes influence the outputs or results [18].…”
Section: Sensitivity Analysis With Doementioning
confidence: 99%