2017 XVII Workshop on Information Processing and Control (RPIC) 2017
DOI: 10.23919/rpic.2017.8214311
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PSD retrieval by Bayesian data fusion via metropolis-hastings and the Jackknife procedure

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Cited by 3 publications
(11 citation statements)
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“…The SEM micrographs are the result of a direct microscopy measurement technique and allow capturing details from the structure on the surface of the particles. However, they are experimentally expensive and the electron beam may distort the results [10]. Electron microscopy methods have been widely simulated using the MC method.…”
Section: Physical Problem: Sem and Sls Modellingmentioning
confidence: 99%
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“…The SEM micrographs are the result of a direct microscopy measurement technique and allow capturing details from the structure on the surface of the particles. However, they are experimentally expensive and the electron beam may distort the results [10]. Electron microscopy methods have been widely simulated using the MC method.…”
Section: Physical Problem: Sem and Sls Modellingmentioning
confidence: 99%
“…For reasons of simplicity, the complete process of SEM microscopic imaging has not been simulated here. This work uses a simplified random sampling MC routine as described in a previous article [3] and is applied to a sample of a low number of particles, that is far below the several hundreds needed in order to make a reliable statistics per se [10].…”
Section: Physical Problem: Sem and Sls Modellingmentioning
confidence: 99%
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