Proceedings of the 11th SEGJ International Symposium, Yokohama, Japan, 18-21 November 2013 2013
DOI: 10.1190/segj112013-020
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Pseudo resistivity cross section imaging using VLF-EM data

Abstract: Electromagnetic waves with single or limited frequencies from VLF transmitters generate secondary induced components of magnetic field, which are used to detect localized changes in electrical conductivity contrasts. This method, so-called VLF-EM, has been the powerful tool for mapping subsurface geological structures because of its low cost and short working hours. However, it has not been tested to estimate a pseudo-resistivity section, both the apparent resistivity and the depth of the conductive anomaly by… Show more

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