Pull-off Force Measurements between Rough Surfaces by Atomic Force Microscopy

Beach, Elvin; Tormoen, Garth W.; Drelich, Jaroslaw; Han, Ruijing

doi:10.1006/jcis.2001.8126

Cited by 181 publications

(150 citation statements)

References 42 publications

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“…Hence, we refer to Section 7.2. Yet some theoretical results [351][352][353][354] are generally valid, also for usual AFM-tips on rough samples. The surface energy of polar materials has been the object of several theoretical and experimental works in the past few years.…”

Section: Determination Of Hamaker Constants Adhesion and Surface Enementioning

confidence: 99%

“…The model was found to adequately describe the decrease in adhesion for increasing roughness on titanium deposited on silicon wafers [557]. Beach et al [352] applied this model successfully to analyze pull-off forces of glass and lactose particles from rough surfaces (series of polypropylene coatings, polycarbonate, and acrylonitrile-butadiene-styrene). The adhesion of beclomethasone dipropionate and polystyrene particles to polypropylene was underestimated by about an order of magnitude.…”

Section: Influence Of Roughness On Adhesionmentioning

confidence: 99%

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Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,242

2,949

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Section: Determination Of Hamaker Constants Adhesion and Surface Enementioning

confidence: 99%

Section: Influence Of Roughness On Adhesionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,242

2,949

View full text Add to dashboard Cite

“…Elasticity (Davies et al, 2005;Perkins et al, 2009Perkins et al, , 2007 Deformation (local) Hardness (Masterson and Cao, 2008;Perkins et al, 2009) Degradation during storage or processing (Perkins et al, 2009) Force distance measurements Elastic modulus Elasticity (Davies et al, 2005;Perkins et al, 2009, 2007 Hardness (Masterson and Cao, 2008;Perkins et al, 2009) Adhesion Degradation during storage or processing (Perkins et al, 2009) Crystallinity (Perkins et al, 2007) Particle surface energetics (Davies et al, 2005;Perkins et al, 2009) Chemical surface properties (Hooton et al, 2004) Correlation of surface specific properties (Perkins et al, 2007;Ward et al, 2005) Colloidal probe AFM Adhesion Physical interaction between materials (Beach et al, 2002;Hooton et al, 2004;Rogueda et al, 2011) Chemical interaction between materials (Hooton et al, 2004;Islam et al, 2014;Rogueda et al, 2011) Cohesive adhesive balance (Begat et al, 2004a;Jones et al, 2008a,b) Particle surface energetics (Hooton et al, 2006a) Electrostatic surface properties (Götzinger and Peukert, 2003;Kwek et al, 2011) Triboelectric charging (Kwek et al, 2011) Surface polarity (Kwek et al, 2011) Fig. 1.…”

Section: Phase Imagingmentioning

confidence: 99%

“…All methods are based on an ideally smooth surface even though the impact of morphology and roughness is generally acknowledged and investigated (Beach et al, 2002). Increased surface roughness leads to a decrease in contact area as shown in Fig.…”

Section: Roughness and Deformationmentioning

confidence: 99%

“…While the exact effects of changing morphology can be hard to quantify, researchers agree that decreasing smoothness (which reduces the contact area) leads to decreased adhesive interaction between two bodies and improved formulation performance (Adi et al, 2008(Adi et al, , 2013Götzinger and Peukert, 2003;Hooton et al, 2003). Beach et al (2002) evaluated the impact of geometry and roughness on adhesive forces by imprinting the contact surfaces of beclomethasone dipropionate, lactose and a peptide-type material on a fluoropolymer film and evaluating shape and size from the indentation. They were thus able to explain the broad distribution of snap-off values based on differences in contact area.…”

Section: Adhesion Measurementsmentioning

confidence: 99%

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Characterisation of dry powder inhaler formulations using atomic force microscopy

Weiss

McLoughlin

Cathcart

2015

International Journal of Pharmaceutics

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A B S T R A C TInhalation formulations are a popular way of treating the symptoms of respiratory diseases. The active pharmaceutical ingredient (API) is delivered directly to the site of action within the deep lung using an inhalation device such as the dry powder inhaler (DPI).The performance of the formulation and the efficiency of the treatment depend on a number of factors including the forces acting between the components. In DPI formulations these forces are dominated by interparticulate interactions. Research has shown that adhesive and cohesive forces depend on a number of particulate properties such as size, surface roughness, crystallinity, surface energetics and combinations of these. With traditional methods the impact of particulate properties on interparticulate forces could be evaluated by examining the bulk properties. Atomic force microscopy (AFM), however, enables the determination of local surface characteristics and the direct measurement of interparticulate forces using the colloidal probe technique. AFM is considered extremely useful for evaluating the surface topography of a substrate (an API or carrier particle) and even allows the identification of crystal faces, defects and polymorphs from high-resolution images. Additionally, information is given about local mechanical properties of the particles and changes in surface composition and energetics. The assessment of attractive forces between two bodies is possible by using colloidal probe AFM.This review article summarises the application of AFM in DPI formulations while specifically focussing on the colloidal probe technique and the evaluation of interparticulate forces.2015 Elsevier B.V. All rights reserved.

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Direct Measurement of Interparticle Forces of Titan Aerosol Analogs (“Tholin”) Using Atomic Force Microscopy

Hörst

et al. 2017

JGR Planets

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To understand the origin of the dunes on Titan, it is important to investigate the material properties of Titan's organic sand particles on Titan. The organic sand may behave distinctively compared to the quartz/basaltic sand on terrestrial planets (Earth, Venus, and Mars) due to differences in interparticle forces. We measured the surface energy (through contact angle measurements) and elastic modulus (through Atomic Force Microscopy) of the Titan aerosol analog (tholin). We find that the surface energy of a tholin thin film is about 70.9 mN/m, and its elastic modulus is about 3.0 GPa (similar to hard polymers like PMMA and polystyrene). For two 20 μm diameter particles, the theoretical cohesion force is therefore 3.3 μN. We directly measured interparticle forces for relevant materials: tholin particles are 0.8 ± 0.6 μN, while the interparticle cohesion between walnut shell particles (a typical model materials for the Titan Wind Tunnel, TWT) is only 0.4 ± 0.1 μN. The interparticle cohesion forces are much larger for tholins and presumably Titan sand particles than materials used in the TWT. This suggests that we should increase the interparticle force in both analog experiments (TWT) and threshold models to correctly translate the results to real Titan conditions. The strong cohesion of tholins may also inform us how the small aerosol particles (∼1 μm) in Titan's atmosphere are transformed into large sand particles (∼200 μm). It may also support the cohesive sand formation mechanism suggested by Rubin and Hesp (2009), where only unidirectional wind is needed to form linear dunes on Titan.

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Pull-off Force Measurements between Rough Surfaces by Atomic Force Microscopy

Cited by 181 publications

References 42 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Characterisation of dry powder inhaler formulations using atomic force microscopy

Direct Measurement of Interparticle Forces of Titan Aerosol Analogs (“Tholin”) Using Atomic Force Microscopy

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