Pulse-coupling measurement of coupled microstrip lines using a micromachined picosecond optical near-field probe

Lee, J.; Lee, H.; Baek, Seungyong; Jeong, You Chul; Kim, J.

doi:10.1109/22.954778

Cited by 5 publications

(4 citation statements)

References 19 publications

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“…Although CPW components fabricated on LT-GaAs and activated by an integrated PC switch were tested in this work, the mapping system used can be applied to the investigation of arbitrary planar components, whether passivated or not. In addition, arbitrary components fabricated on arbitrary substrates can be tested when the PCNFP and the external signal source, such as a photodetector, are synchronized [10].…”

Section: Discussionmentioning

confidence: 99%

“…Probe laser pulses guided via an optical fiber activated the PC switch on the PCNFP so that the PCNFP could freely access any in-circuit measurement positions with uniform sensitivity. It was demonstrated both numerically [5] and experimentally [10], that the PCNFP detected the original shape of the incident electromagnetic field with picosecond temporal resolution, and that it detected only the electric-field component with the same direction as that of the PC switch of the probe. For time-resolved 2-D near-field mapping, the PCNFP was coupled with a computer-controlled -translation stage, and scanned at a height of 100 m above the DUTs.…”

Section: Measurement Systemmentioning

confidence: 99%

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Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping

Lee

Kim

2002

IEEE Trans. Adv. Packag.

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For the first time, the picosecond electric-pulse propagation characteristics of a few coplanar waveguide (CPW) components, including transmission lines, capacitive open and short terminations and a right-angle bend, have been successfully measured by mapping the time-dependent tangential near-electric-field distributions. The measurement was performed using a two-dimensional photoconductive (PC) near-field mapping system incorporating a recently developed novel PC electric-field probe, which could measure the separate picosecond orthogonal electric-field components with minimal loading effects. The resulting field-images mapped over the structural capacitive open termination and the short termination, showed previously unknown, and quite remarkable, transient picosecond electric-pulse reflection phenomena, which cannot be measured using conventional test instruments. In addition, the images showed that reflection-phenomenon itself required about 1 ps of propagation delay, and that the pulse-reflection from the capacitive open-termination required additional time delay matched to the length of the open-gap between the two slots of the CPW. We also found that at a CPW right-angle bend, comparable part of the energy of the guided signal leaks from the bend to the outer ground plane as radiating energy, and that two series-connected CPW discontinuities can remove the coupled-slotline mode generated at one of the discontinuities without using any additional component, such as an air-bridge.

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Section: Discussionmentioning

confidence: 99%

Section: Measurement Systemmentioning

confidence: 99%

Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping

Lee

Kim

2002

IEEE Trans. Adv. Packag.

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“…To check the sensitivity and the minimum detectable signal of the probe, a commercial photodetector activated by pump laser pulses was connected to a microstrip line on a PCB (FR4) substrate [17]. Probe pulses with average power of 3 mW were injected into the 30-cm-long optical fiber used to activate the PC switch of the PCNFP.…”

Section: Other Factorsmentioning

confidence: 99%

A micromachined photoconductive near-field probe for picosecond pulse propagation measurement on coplanar transmission lines

Lee

et al. 2001

IEEE J. Select. Topics Quantum Electron.

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“…In the present study, we have a particular focus on the coupled line (CL) based passive circuit [19][20][21][22][23]. In brief, the timeline of CL structure transient analysis can be summarized chronologically with lossless [19], lossy [20] and circulant symmetric [21][22], picosecond-duration pulse coupling measurement technique [24] and composite rightand left-handed (CRLH) metamaterial [23] structures. Based on the FDTD computational algorithm, certain properties of CRLH [23][24][25][26] and negative refractive index (NRI) [27] metamaterial structures were analyzed in the TD.…”

Section: Introductionmentioning

confidence: 99%

Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit

Wan

Mefteh

et al. 2021

IEEE Access

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An innovative transient study of RF and microwave circuit operating with bandpass (BP) negative group delay (NGD) function is devoted in this paper. The developed unfamiliar circuit BP-NGD analysis is applied to an original barcode-shape microwave passive topology. The design method of the BP-NGD barcode microstrip circuit is described. The circuit under study is implemented in order to operate as a tri-band NGD function. Furthermore, the different steps of the BP-NGD transient analysis adapted to triband aspect is explained. Before the time-domain (TD) testing, it is particularly important to define the transient parameters from the frequency domain analysis. In other words, the BP-NGD specifications of the circuit under test (CUT) must be determined. Similar to all RF and microwave circuits, the BP-NGD one is specified based on the S-parameter model. To realize the transient analysis, we have considered a Gaussian pulse as input signal in order to analytically define the TD characteristics in function of the NGD bandwidth (BW) and center frequency. The feasibility of the developed BP-NGD transient study is illustrated by experimentation based on ultra-wide band (UWB) pulse generator. As proof-of-concept, barcode NGD circuit exhibiting tri-band NGD value-center frequency-bandwidth, (-5.9 ns, 2.128 GHz, 20 MHz), 2.3 GHz, 14 MHz) and 2.42 GHz, 14 MHz), respectively, has been fabricated and tested. The transient simulations and experiences confirm the transient BP-NGD behavior. It is emphasized that the output signal envelopes of the barcode NGD prototype present leading and tailing edges in time-advance of input ones when the carrier frequency is equal to the NGD center frequency.

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Pulse-coupling measurement of coupled microstrip lines using a micromachined picosecond optical near-field probe

Cited by 5 publications

References 19 publications

Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping

Characterization of picosecond electric-pulse propagation on CPW components by transient near-field mapping

A micromachined photoconductive near-field probe for picosecond pulse propagation measurement on coplanar transmission lines

Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit

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