2009
DOI: 10.1016/j.apsusc.2008.07.159
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Pulsed laser deposition and characterization of nitrogen-substituted SrTiO3 thin films

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Cited by 27 publications
(21 citation statements)
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“…17, 19, and 24͔͒ and NH 3 is also likely to chemically affect the STO during its integration in MIM capacitors. [25][26][27][28] Regarding Ru precursors, considerable attention has been devoted to new compounds, which have an improved reactivity and volatility. 34 in the case of Pt.…”
Section: Introductionmentioning
confidence: 99%
“…17, 19, and 24͔͒ and NH 3 is also likely to chemically affect the STO during its integration in MIM capacitors. [25][26][27][28] Regarding Ru precursors, considerable attention has been devoted to new compounds, which have an improved reactivity and volatility. 34 in the case of Pt.…”
Section: Introductionmentioning
confidence: 99%
“…The injected gas crosses the ablation plume close to its origin resulting in dissociation and activation of the gas pulse molecules via collisions with the high-energetic ablation plasma species. The utilization of oxygen-containing gases helps to overcome oxygen deficiencies in films [15], while the use of nitrogen (N 2 ) or ammonia (NH 3 ) allows the deposition of nitrogen-substituted films [14,17]. In this study, both nitridizing gases were used for the gas pulse and background gas.…”
Section: Methodsmentioning
confidence: 99%
“…The purpose of the pulsed gas valve is to use a reactive gas when transfer and deposition of material occurs, but also to provide a higher partial pressure during the interactions, yet to maintain a defined and low background pressure. Another example is the controlled substitution of ions in a growing film like N-doped SrTiO 3 [8,9]. 5.1c).…”
Section: Pulsed Laser Ablationmentioning
confidence: 99%
“…Changing the background gas to other gases such as NH 3 to provide reactive nitrogen, the composition of a film can be substantially changed [8,9]. This high flux could change the film and substrate surface energies and will increase the oxygen content, like in oxide thin films.…”
Section: Nanosecond Laser Irradiationmentioning
confidence: 99%