1986
DOI: 10.1063/1.336690
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Pulsed photothermal modeling of layered materials

Abstract: Exact analytical solutions of the heat-diffusion problem encountered in the pulsed photothermal evaluation of layered materials are presented. The analysis relates to the long-time decay of the front face temperature following the absorption of a surface heat pulse. The configuration of a coating on a substrate is analyzed, and the parameters governing the temperature evolution are identified with a particular emphasis on the thermal contact resistance term. This model provides a new method of measuring the qu… Show more

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Cited by 313 publications
(133 citation statements)
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“…This indicates that the interface between two different metallic layers can alter the thermal transport in a direction perpendicular to the film plane. Dur goal is to use TTR to measure the thermal impedance of interfaces by fitting our results to a one-dimensional heat flow model which includes the interfacial boundary condition [9] aTaT + 1…”
Section: 6~----------~--------------------------mentioning
confidence: 99%
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“…This indicates that the interface between two different metallic layers can alter the thermal transport in a direction perpendicular to the film plane. Dur goal is to use TTR to measure the thermal impedance of interfaces by fitting our results to a one-dimensional heat flow model which includes the interfacial boundary condition [9] aTaT + 1…”
Section: 6~----------~--------------------------mentioning
confidence: 99%
“…As a result, the accuracy of determining the film thermal diffusivity will depend on the precis ion to which the substrate thermal properties are known: The thermal impedance of the film-substrate interface can also complicate the determinat ion of the film thermal properties. Although the theoretical treatments of heat flow in a simple multilayer system are correct, they only account for heat flow across ideal boundaries where there is an abrupt change in thermal properties [6][7][8][9]. In reality.…”
mentioning
confidence: 99%
“…This could be clearly traced in the works ofD. L. Balageas, P. Cielo, J.-C. Krapez et al devoted to the effusivity measurements [1,2]. In the USSR, V.Vavilov used the term PHENOMENOLOGICAL DESCRIPTION OF TIIE DIT ALGORITHM Two weIl known relationships between thennal NDE parameters create the basis for DTT.…”
Section: Introductionmentioning
confidence: 99%
“…This approach has elements in common with the technique of photothermal radiometry [3,4] although in our work we use a step heating source as opposed to a pulsed source. We implement our technique with detection using an infrared scanner to allow quasi-parallel acquisition of image data.…”
mentioning
confidence: 99%