2020
DOI: 10.1016/j.sab.2020.105865
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Pulsed radiofrequency glow discharge time-of-flight mass spectrometry: Depth profile analysis of multilayers on conductive and non-conductive substrates

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Cited by 2 publications
(8 citation statements)
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“…217 Two U isotopic reference materials (CRM U-020 and CRM U-030) were also measured for quality assurance, ion counter gains and mass bias correction. Similar to the study by Varga et al, 215 LA-MC-ICP-MS was highlighted for its ability to identify inhomogeneous distribution of U within samples, with the large range of 235 U enrichment conrmed using SIMS, and four of the ve samples tested containing 236 U, indicative of the presence of reprocessed U.…”
Section: Nuclear Materialsmentioning
confidence: 76%
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“…217 Two U isotopic reference materials (CRM U-020 and CRM U-030) were also measured for quality assurance, ion counter gains and mass bias correction. Similar to the study by Varga et al, 215 LA-MC-ICP-MS was highlighted for its ability to identify inhomogeneous distribution of U within samples, with the large range of 235 U enrichment conrmed using SIMS, and four of the ve samples tested containing 236 U, indicative of the presence of reprocessed U.…”
Section: Nuclear Materialsmentioning
confidence: 76%
“…225 A 30 second extraction step achieved quantitative recovery with approximately 100 ng sampled per extraction. The intra sample variability was around 30% RSD, which the authors claim was offset by <10% RSD for 235 U/ 238 U and (for enriched samples) 234 U and 236 U ratios. An additional benet was that it is a convenient, versatile approach for swipe samples in a range of applications.…”
Section: Nuclear Materialsmentioning
confidence: 85%
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