Pulsed RF calibration for NVNA measurements

Roblin, Patrick; Ko, Youngseo; Jang, Haedong; Teyssier, Jean-Pierre

doi:10.1109/arftg.2012.6422437

Cited by 4 publications

(2 citation statements)

References 3 publications

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“…There is a certain amount of wobble in even the thru phase measurement partially because of how the pulse was positioned. One possibility would be dispersion in the IF system as has been discussed elsewhere (e.g., [12]). In this particular system, there was less than 0.25 degrees of phase deviation across the IF bandwidth but it may be a contributor.…”

Section: Measurementsmentioning

confidence: 98%

“…This paper will focus on cases where stimulus RF pulsing is present (perhaps in conjunction with bias/control pulsing). Historically (e.g., [5], [12]), often the stimulus pulse was assumed settled prior to any measurements and in most cases this is quite reasonable. In higher resolution measurements (e.g., where DUT overshoot is of concern) or when rise/fall pathologies are being studied (hence measurements must occur on the envelope edge), the modulator influence on the measurement and the calibration may need to be revisited.…”

Section: Introductionmentioning

confidence: 99%

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Edge-related calibration and measurement characteristics in pulsed profile S-parameter analysis

Martens¹

2013

81st ARFTG Microwave Measurement Conference

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Pulsed profile S-parameter measurements have been performed for decades but as measurement hardware characteristics have changed (in terms of resolution, dynamic range and basic data acquisition); there may be gains to be made in re-examining calibration and measurement details. One candidate area is with pulsed stimulus measurements where edge-related performance is of interest and there are many choices with regard to modulator position, levels of correction of the modulation dynamics and correction indexing. By timeindexing error coefficients as well as raw S-parameter data, in a phase coherent fashion, some improvement in the corrected results near pulse edges seems possible in a number of cases when resolution is high.

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Section: Measurementsmentioning

confidence: 98%

Section: Introductionmentioning

confidence: 99%

Edge-related calibration and measurement characteristics in pulsed profile S-parameter analysis

Martens¹

2013

81st ARFTG Microwave Measurement Conference

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Measurement system transient and power questions in mm-wave high resolution pulsed S-parameter measurements

Martens¹

2013

82nd ARFTG Microwave Measurement Conference

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Mm-wave pulse profile measurements can present challenges in part due to high multiplication factors sometimes needed, the position of stimulus modulation (often part way in a multiplier chain), video poles present in some of the elements and generally more difficult linearity questions. These issues have been explored in the 80-500 GHz range and the behavior between modulation and final multiplication was the most dynamic introducing both easily correctable distortions and single-shot effects that are more challenging to process. Resolution, down to the scale of a few ns, did not seem to be affected when reasonable alignment and isothermal procedures were followed. The stimulus power effects also seemed to be minimal when coupled with sufficiently linear receivers. Example calibrations and measurements have been performed for ~20 dBm W-band and D-band systems and lower power WR-2.2 systems.

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