Pump-Probe Time-Resolved Sum Frequency Spectroscopy of the H-Si(111)1&amp;times;1 surface

Hien, Khuat Thi Thu; Miyauchi, Yuhei; Mizutani, Goro

doi:10.1380/ejssnt.2010.89

Cited by 3 publications

(4 citation statements)

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“…4(a) is not clear. However, we speculate that the spatial variation as a function of depth of the surviving e–h pairs after Auger recombination may have caused electric field induced SFG 12…”

Section: Resultsmentioning

confidence: 92%

“…According to Guyot‐Sionnest, the slow change of the SF intensity from 100 to 500 ps is due to the surface temperature change. On the other hand, Hien et al 12 postulated that the SF intensity change as a function of time up to ∼1 ns under stronger optical excitation was not caused by the surface temperature only 12. Thus, the origin of the broader component in the SF intensity profile seen after 277 ps in Fig.…”

Section: Resultsmentioning

confidence: 94%

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Construction of a pump‐probe system for observing time‐resolved sum frequency images

Hien

Miyauchi

Mizutani

2010

Surface & Interface Analysis

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We combined a pump-probe technique with optical sum frequency microscopy, and demonstrated a time-resolved SF intensity image observation of an H-Si(111) surface in ultrahigh vacuum (UHV) conditions. After pump-light irradiation of photon energy 2.33 eV, pulse duration ∼30 ps, and the width of the spot ∼304 µm, SF intensity image resonant to the Si-H stretching vibration with IR probe wavenumber of 2085 cm −1 was darkened dramatically at 0 ps and then gradually recovered. Nonresonant SF signals with IR probe wavenumber of 2020 cm −1 increased at the probe delay time ∼0 ps, and then decreased with the life time of ∼1 ns. The width of the spatial profile of the nonresonant signal was at a minimum of ∼436 µm at the delay time 26 ps, and then increased to ∼673 µm at 930 ps. The origins of these behaviors of the SF intensity images are discussed.

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Section: Resultsmentioning

confidence: 92%

Section: Resultsmentioning

confidence: 94%

Construction of a pump‐probe system for observing time‐resolved sum frequency images

Hien

Miyauchi

Mizutani

2010

Surface & Interface Analysis

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“…For SFG and, as a matter of fact, also for IRAS, a similar mechanism exists and has been experimentally exploited in the past to measure the relaxation time of targeted vibrational modes. The method is based on a pump-and-probe strategy, and involves saturating the vibration with an IR pump beam before SFG (or IRAS) probing [124][125][126]. The signal is quenched for pump-probe delays shorter than the vibration lifetime, and recovered for longer ones.…”

Section: Accepted Manuscriptmentioning

confidence: 99%

Metrology and nano-mechanical tests for nano-manufacturing and nano-bio interface: Challenges & future perspectives

et al. 2018

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Nanometrology refers to measurement techniques that assess materials properties at the nanoscale. Laboratory-based characterisation of nanomaterials has been the key enabler in the growth of nanotechnology and nano-enabled products. Due to the small size involved, dimensional measurements has dominated such characterisation underpinned by a tremendous development in stand-alone electron/ion microscopes and scanning probe microscopes. However, the scope of nanometrology extends far beyond off-site, laboratory-based measurements of dimensions only, and is expected to have a tremendous impact on design of nano-enabled materials and devices. In this article, we discuss some of the available techniques for laboratory-based characterisation of mechanical and interfacial properties for nanometrology. We also provide a deep insight into the emerging techniques in measuring these properties, keeping in view the need in advanced manufacturing and nanobio-interactions to develop multifunctional instrumentation, traceable and standardized methods, and modelling tools for unambiguous data interpretation. We also discuss the evaluation of nanomechanical properties and surface/interface response of materials, within the purview of manufacturing processes and standardization. Finally, we discuss scientific and technological challenges that are required to move towards real-time nano-characterisation for rapid, reliable, repeatable and predictive metrology to underpin upscaling nanomaterials and nano-enabled products from the research field to industry and market

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“…However, no one has developed SFG microscopy for observing a sample in UHV conditions. Thus, we decided to develop a multifunctional SFG microscope to facilitate convenient analysis of a semiconductor surface under UHV conditions [28][29][30][31][32].…”

Section: Sfg and Shg Microscopymentioning

confidence: 99%

Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions

Miyauchi

2012

Physics Research International

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This paper reviews the use of optical sum frequency generation (SFG) and second harmonic generation (SHG) microscopy under ultra-high vacuum (UHV) conditions to observe the dynamics of a hydrogen terminated Si(111)1 × 1 surface. First, we took SFG and SHG microscopic images of the surface after IR light pulse irradiation and found that the SHG and nonresonant SFG signals were enhanced, probably due to the formation of dangling bonds after hydrogen desorption. Second, we observed time-resolved SFG intensity images of a H-Si(111)1 × 1 surface. After visible pump light irradiation, the nonresonant SFG signal increased at probe delay time 0 ps and then decreased over a life time of 565 ps. The resonant SFG signal reduced dramatically at 0 ps and then recovered with an anisotropic line shape over a life time of 305 ps. The areas of modulated SFG signals at delay time 277 ps were expanded with an anisotropic aspect. Finally, we observed SFG intensity images of hydrogen deficiency on a Si(111)1 × 1 surface as a function of temperature. These images of the H-Si(111) surface, taken with a spatial resolution of 5 μm at several temperatures from 572 to 744 K, showed that the hydrogen desorbs homogeneously.

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Pump-Probe Time-Resolved Sum Frequency Spectroscopy of the H-Si(111)1×1 surface

Cited by 3 publications

References 10 publications

Construction of a pump‐probe system for observing time‐resolved sum frequency images

Construction of a pump‐probe system for observing time‐resolved sum frequency images

Metrology and nano-mechanical tests for nano-manufacturing and nano-bio interface: Challenges & future perspectives

Second-Order Nonlinear Optical Microscopy of a H–Si(111)1 × 1 Surface in Ultra-High Vacuum Conditions

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