Pyroelectric properties of sol-gel derived PZT thin films with various Zr/Ti ratios

Teowee, G.; McCarthy, F. S.; McCarthy, K. C.; Dietz, Barbara; Uhlmann, D. R.

doi:10.1080/10584589808208063

Cited by 7 publications

(5 citation statements)

References 8 publications

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“…This result is comparable to those reported for hulk ceramics [ 141, but the values obtained near the MPB remain higher lor ceramics. This feature is also observed for PZT films grown by sol-gel [15,16] or MOCVD [17].…”

Section: Dielectric Dropellmentioning

confidence: 54%

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

Soyer

Haccart

Cattan

et al. 2001

Integrated Ferroelectrics

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Section: Dielectric Dropellmentioning

confidence: 54%

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

Soyer

Haccart

Cattan

et al. 2001

Integrated Ferroelectrics

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“…This composition of PZT film has also been prepared by sol-gel method. This film has reportedly shown lower ò r and loss compared to 53/47 PZT film [32]. Also 35/65 PZT has been reported as a suitable material ferroelectric memories due to excellent fatigue properties [40].…”

Section: Introductionmentioning

confidence: 86%

“…Because PZT of this composition possesses high optical transparency, and electro optic effects [29]. But below MPB, very less studies have been reported [30][31][32].…”

Section: Introductionmentioning

confidence: 99%

Synthesis of Pb(Zr_0.35−xMn_xTi_0.65)O₃, x = 0.00, 0.02, 0.06, 0.10 ceramics and their structural, dielectric characteristics

Tiwari

Babu

Choudhary

2020

Mater. Res. Express

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The samples of stoichiometry Pb(Zr 0.35−x Mn x Ti 0.65 )O 3 , x=0.00, 0.02, 0.06, 0.10 (PZMT) were synthesized by solid state reaction route. For the first time, 35/65 lead zirconate titanate ceramics were modified by manganese (Mn) by replacing zirconium. X-ray diffraction (XRD) study has confirmed the formation of tetragonal phase in samples and no structural change has been observed due to Mn doping. Results of scanning electron microscopy (SEM) showed polycrystalline nature through shape, size and grain distribution in microstructures of all samples. At room temperature, the samples have shown identical nature in variation of dielectric constant (ò r ) and tangent loss (tanδ) with frequency. At 50 kHz frequency, the value of maximum dielectric constant (ò max ) has been changed from 5440 to 12 562 due to Mn. With increase in doping amount of Mn, the values of Curie temperature (T c ) have been decreased from 435 to 373°C.d Tan of samples is decreased with increase in the dopant concentration. The diffusivity of PZT has increased with 2% of Mn doping. But further increase in the Mn concentration has decreased the diffusiveness of the samples.

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“…Ferroelectric memories have a brilliant future versus traditional memories [1][2][3]. Lead zirconate titanate (PZT) is one of the most promising ferroelectric materials for memory use due to high remanent polarization (P r ) and low coercive field (E c ), etc.…”

Section: Introductionmentioning

confidence: 99%

Improving the fatigue endurance of lead zirconate titanate thin films through PbO interfacial modification

Rong

Ren

et al. 2011

Rare Metals

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The effects of the modification of electrode/ceramic interfaces through a chemical solution deposition-derived PbO buffer layer on the fatigue endurance of lead zirconate titanate (PZT) thin films were investigated. The grain size and the surface roughness of the PZT films increased through PbO interfacial modification. Moreover, the PZT films with PbO interfacial modification had a better crystallographic structure and no evident secondary phases were observed. While the remanent polarization and dielectric constant were reduced, the fatigue endurance was improved. Based on the results, the mechanism for the fatigue endurance improvement was discussed.

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Pyroelectric properties of sol-gel derived PZT thin films with various Zr/Ti ratios

Cited by 7 publications

References 8 publications

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

Synthesis of Pb(Zr_0.35−xMn_xTi_0.65)O₃, x = 0.00, 0.02, 0.06, 0.10 ceramics and their structural, dielectric characteristics

Improving the fatigue endurance of lead zirconate titanate thin films through PbO interfacial modification

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Pyroelectric properties of sol-gel derived PZT thin films with various Zr/Ti ratios

Cited by 7 publications

References 8 publications

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

Synthesis of Pb(Zr0.35−xMnxTi0.65)O3, x = 0.00, 0.02, 0.06, 0.10 ceramics and their structural, dielectric characteristics

Improving the fatigue endurance of lead zirconate titanate thin films through PbO interfacial modification

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Synthesis of Pb(Zr_0.35−xMn_xTi_0.65)O₃, x = 0.00, 0.02, 0.06, 0.10 ceramics and their structural, dielectric characteristics