1991
DOI: 10.1179/sur.1991.7.2.145
|View full text |Cite
|
Sign up to set email alerts
|

Quality Assurance Assessment of Thin Films

Abstract: Thin films produced by a number of deposition technologies have found many applications over the past few years in a range of sectors of engineering. As the use of such coatings becomes widespread, the need to assess the quality and reliability of these films becomes more important, for both coating suppliers as a means of process monitoring and end users as a means of identifying if the properties of the coating are suitable for the intended application. There are a number of coatings evaluation tests which a… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1993
1993
2009
2009

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(2 citation statements)
references
References 12 publications
0
2
0
Order By: Relevance
“…In this phase it is practical to distinguish between characterisations with respect to structure and composition, and characterisation with respect to the other properties. Hantsche (1990) and Bull et al (1991) reported that it is not sufficient to characterise only the function and structure of a few atomic layers; Tavares et al (1997) suggested that the entire modified zone has to be taken into account, and problems with the interface also have to be dealt with. In view of these considerations, a coating system involving substrate-bulk material (e.g.…”
Section: Step 1: Selection and Characterisation Of Substrate And Coatingmentioning
confidence: 98%
“…In this phase it is practical to distinguish between characterisations with respect to structure and composition, and characterisation with respect to the other properties. Hantsche (1990) and Bull et al (1991) reported that it is not sufficient to characterise only the function and structure of a few atomic layers; Tavares et al (1997) suggested that the entire modified zone has to be taken into account, and problems with the interface also have to be dealt with. In view of these considerations, a coating system involving substrate-bulk material (e.g.…”
Section: Step 1: Selection and Characterisation Of Substrate And Coatingmentioning
confidence: 98%
“…An optical microscope (EPIVAL) equipped with a microhardness tester (mhp 160) was used to measure the hardness of the layers according to the Knoop method [11]. Six samples corresponding to nitrogen partial pressures ranging from 0.01 Pa to 0.1 Pa (see table 1) were mounted one at a time in the sample holder of the Tacitus variable-energy positron beam.…”
Section: Methodsmentioning
confidence: 99%