2015
DOI: 10.1016/j.nimb.2015.01.041
|View full text |Cite
|
Sign up to set email alerts
|

Quantification estimate methods for synchrotron radiation X-ray fluorescence spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
8
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 7 publications
(8 citation statements)
references
References 18 publications
0
8
0
Order By: Relevance
“…While the presence of Pb in bone may indicate that the subject was exposed to Pb while living, diagenesis could also be the source of Pb. Quantification of the lead levels using the confocal XFI image for sample B18 (Bewer ) yielded whole‐bone Pb concentration levels consistent with the ICP–MS level, though typically 10–25% lower. Of greater interest is the ability to glean localized Pb concentration methods from this method.…”
Section: Resultsmentioning
confidence: 68%
See 2 more Smart Citations
“…While the presence of Pb in bone may indicate that the subject was exposed to Pb while living, diagenesis could also be the source of Pb. Quantification of the lead levels using the confocal XFI image for sample B18 (Bewer ) yielded whole‐bone Pb concentration levels consistent with the ICP–MS level, though typically 10–25% lower. Of greater interest is the ability to glean localized Pb concentration methods from this method.…”
Section: Resultsmentioning
confidence: 68%
“…Moreover, localized quantitative information about the elements is available from confocal XFI maps given that self‐absorption of incident and fluorescent X‐rays can be estimated (De Samber et al . ; Bewer ). Quantitative elemental analysis may aid in the differentiation of acute or chronic exposure to toxic elements.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…A key assumption of quantitative XRF is that the photons within the X-ray beam are uniformly distributed in a circular or square profile (Bewer, 2015;Kanngiesser, 2003). Such uniform profiles ensures equal sampling within the beam and across the sample surface.…”
Section: Introductionmentioning
confidence: 99%
“…Such uniform profiles ensures equal sampling within the beam and across the sample surface. In reality, it is difficult to produce a perfectly uniform beam shape, as synchrotron radiation is inherently structured as a result of the nature of the electron source (Bewer, 2015). A micro-or nano-X-ray beam is typically focused by a mirror system or zone plates.…”
Section: Introductionmentioning
confidence: 99%