“…One reason is that labeling those images is labor-intensive, tedious, and repetitive work, whether ascertaining defect levels or calculating damage diameters. Fortunately, Project Ada is one of them, pursued by Nina et al [ 47 ] and collaborated with the Shanghai Institute of Ceramics, Chinese Academy of Sciences. Over twenty thousand thin-film defect images have been taken in this dataset, including multiple annealing methods and two different shooting light environments (Brightfield conditions for cracks, dewetting, parts, and scratches; Darkfield conditions for cracks, dewetting, no cracks, and no dewetting).…”