2017
DOI: 10.1002/aenm.201602026
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Quantifying Recombination Losses during Charge Extraction in Bulk Heterojunction Solar Cells Using a Modified Charge Extraction Technique

Abstract: A variety of charge extraction (CE) techniques have been developed to measure charge density and recombination coefficients in bulk heterojuction (BHJ) solar cells. Charge recombination during charge extraction as a major limitation of this method has not been systematically quantified. Herein, we report CE measurements using a newly designed fast switch, which enables the application of a reverse bias to the solar cells facilitating charge extraction. With applied reverse bias, more than 40 % increase in the … Show more

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Cited by 12 publications
(15 citation statements)
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“…In fact, the exciton separation is typically accompanied with the charge recombination, which aggravates with enhanced n . [ 17 ] In this case, increasing electric field and the light intensity leads to higher electron concentration and enhanced charge recombination. Hence, we propose that the electric field, screening effect, and charge recombination on photoinduced charges are connected with the coupled modulation of σ.…”
Section: Figurementioning
confidence: 99%
“…In fact, the exciton separation is typically accompanied with the charge recombination, which aggravates with enhanced n . [ 17 ] In this case, increasing electric field and the light intensity leads to higher electron concentration and enhanced charge recombination. Hence, we propose that the electric field, screening effect, and charge recombination on photoinduced charges are connected with the coupled modulation of σ.…”
Section: Figurementioning
confidence: 99%
“…where d is the device thickness, q is the unit charge, t e is the extraction time (usually 1 ms is enough), j ( t ) is the transient current density, C geom is the geometric capacitance, V a the voltage applied prior extraction (in most cases V oc ) and V e is the extraction voltage. The charge on the capacitance needs to be subtracted [ 83 ] because only the charge carrier density inside the bulk is of interest.…”
Section: Characterization Techniquesmentioning
confidence: 99%
“…Instead of the surface passivation mechanism discussed above, the reduced recombination using PEDOT-PSS / and various electron interfacial layers is suggested to originate from the spatial charge separation of electrons and holes near the contacts, induced by the increased built-in electric field. Previous applied-bias and active layer thickness dependent charge extraction measurements suggested a similar mechanism 49. Charge carrier lifetimes in devices with thinner active layers were longer.…”
mentioning
confidence: 63%
“…Note that the photovoltage decay measurements were recorded using a 1 MOhm impedance, set by an oscilloscope.Therefore the decays measured towards the millisecond timescale could be influenced by current through the RC circuit, rather than recombination internally in the device. Therefore the measured curves are compared from the sub-microsecond to 1 ms time scale 49. The much higher transient photovoltage values for the reference device A compared to the steady state measurements (0.26 V) suggest higher charge density, at least initially, in transient measurements compared to what is achievable under AM 1.5 illumination.…”
mentioning
confidence: 99%