2021
DOI: 10.1002/anie.202017153
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Quantifying the Likelihood of Structural Models through a Dynamically Enhanced Powder X‐Ray Diffraction Protocol

Abstract: Structurally characterizing new materials is tremendously challenging,especially when single crystal structures are hardly available which is often the case for covalent organic frameworks.Y et, knowledge of the atomic structure is key to establish structure-function relations and enable functional material design. Herein, an ew protocol is proposed to unambiguously predict the structure of poorly crystalline materials through al ikelihood ordering based on the X-ray diffraction (XRD) pattern. Keyo fthep roced… Show more

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Cited by 15 publications
(21 citation statements)
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“…However, instead of optimizing the structural parameters, ab initio calculations were performed to obtain physically sound structural models. This gave rise to a collection of energetically favored stacking configurations at 0 K. However, as elaborated in our previous work, 58 a static approach to calculate the diffraction patterns introduces large discrepancies with the experiment due to an artificially decreased symmetry in the structures. As such, a dynamic approach was also considered, which accounted for the inherent temporal character of experimental measurements by considering an average PXRD pattern over the course of an MD simulation subjected to a finite pressure and temperature.…”
Section: Interlayer Distancementioning
confidence: 99%
“…However, instead of optimizing the structural parameters, ab initio calculations were performed to obtain physically sound structural models. This gave rise to a collection of energetically favored stacking configurations at 0 K. However, as elaborated in our previous work, 58 a static approach to calculate the diffraction patterns introduces large discrepancies with the experiment due to an artificially decreased symmetry in the structures. As such, a dynamic approach was also considered, which accounted for the inherent temporal character of experimental measurements by considering an average PXRD pattern over the course of an MD simulation subjected to a finite pressure and temperature.…”
Section: Interlayer Distancementioning
confidence: 99%
“…For each material, a static and dynamically averaged PXRD pattern is derived both with the QuickFF and UFF force elds, following our procedure outlined in ref. 50. Dynamical averaging at operando conditions is necessary for COFs to account for the inherent temporal character of experimental measurements.…”
Section: Accuracy Of the System-specic Force Eldsmentioning
confidence: 99%
“…Dynamical averaging at operando conditions is necessary for COFs to account for the inherent temporal character of experimental measurements. 50 In contrast to the static approach, during which the PXRD pattern is calculated for the optimized structure, the dynamic approach starts from an MD trajectory performed at operating conditions. The resulting PXRD pattern is an ensemble average of the pattern calculated for different snapshots from this trajectory.…”
Section: Accuracy Of the System-specic Force Eldsmentioning
confidence: 99%
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